DIFFRAC.EVA

DIFFRAC.EVA provides tools for the quick analysis of one- and two-dimensional diffraction data. It supports all Bruker detectors and XRD scan types. The EVA functionality covers a broad analytical spectrum from data reduction, basic scan evaluation and presentation, detailed peak analysis, phase identification and quantification, to the determination of crystallinity and crystallite size.

EVA interfaces with all relevant databases for phase identification and may additionally use crystal structures and complementary chemical composition information from e.g. XRF based chemical analysis for its award-winning species dentification.

Furthermore, DIFFRAC.EVA supports the efficient evaluation of big data that originate from today’s fast detectors, the use of in-situ environments, high-throughput screening or spatially resolved measurements. The software provides specific chart types, but also advanced chemometrics tools for cluster analysis and pattern-matching based crystalline and amorphous species identification and quantification.

It fully supports conventional file-based tasks but also integrates the DIFFRAC.SUITE database infrastructure for daily work, even in controlled environments as required by the 21 CFR Part 11 regulations for the pharmaceutical industry.

Finally, DIFFRAC.EVA is used for the preparation of publication ready graphs and user specific reports, either directly in EVA or using the DIFFRAC.SUITE RESULTS-MANAGER and the instrument database.

DIFFRAC.EVA is the software of choice to get a first impression of the measurement. An important step is the data reduction from one or several snapshot images of steady detectors or re-binning the pixels from a scanning 2D detector into conventional 1-dimensional XRD data. EVA provides the well-established tools to further analysis of those 1D data. This ranges from routine signal processing to scan arithmetics and more advanced techniques to look at individual peaks and complete scans.

The multi-scan reader quickly loads hundreds of scans and provides a simple overview in a two-dimensional representation. Outliers in regular quality control measurements are easily spotted and specific scans worth a detailed examination can be extracted from reciprocal space maps or series of non-ambient or in-operando measurements.

Supplementary scan information such as measurement position, temperature, humidity, charge states, or even intensity of an individual peak or the amount of amorphous background can be visualized in the side-view. Again, this assists in finding scans of interest for the further examination of phase transformations, the decomposition or formation of phases.

第一个版本以来,伊娃的搜索/匹配模块is generally appreciated as the most reliable and most accurate tool for phase identification. Correspondingly, EVA performed best in an international Search-Match Round Robin (Le Meins et al., 2002,www.cristal.org/smrr). Since then numerous improvements have further differentiated EVA from conventional software for phase analysis

• Highly sophisticated residual search with respect to already identified phases, thus greatly improving analysis of minor phases
• 支持of Variable Counting Time (VCT) and Dynamic Beam Optimization (DBO) data for highly accurate trace phase analysis thanks to significantly decreased Lower Limits of Detection (LLoD)
• Simultaneous search in multiple reference databases, such as the ICDD PDF2/PDF4+/PDF4 Minerals/PDF4 Organics databases
• Grouping of candidate patterns phases to handle the ever-increasing number of similar or nearly identical reference database entries
• 识别阶段and accurate quantitative phase analysis based on RIR (reference intensity ratios) values

• Complete collection of the best algorithms for data integration and evaluation
  
• Innovative design and operation concept for maximum simplicity and flexibility.
• It takes full advantage of modern computers and operating systems like multi-threading, dedicated parallelization, native 64-bit support
• Real-Time-Preview of all evaluations for visual validation
• Reversing an action? No problem! EVA allows to undo and redo
• Highly flexible GUI adapts to the available user hardware, best operation practices and requirements of the various software modules
• Customization to user preferences for individual window layouts, column configurations and screen settings
• High level of integration with the DIFFRAC.SUITE Measurement and Results Manager software
  
• An extensive step-by-step tutorial makes EVA easy to use from the very beginning.