DIFFRAC.LEPTOS

Highlights

Fully featured Materials Research software package

x射线反射率(XRR)提供了详细的information on the vertical sample density profile, layer thicknesses, and interface roughness. High-resolution X-ray diffraction (HRXRD) measures the crystallographic structure of the sample. Grazing-incidence Small Angle Scattering (GISAXS) is used for evaluation of nanoparticles and porosity. Residual Stress analysis probes the strain status of bulk samples and polycrystalline coatings.

Along with conventional single-curve scans, LEPTOS enables analysis of high-resolution HRXRD and XRR reciprocal space maps, GISAXS and XRD² Stress frames, area mapping for HRXRD, XRR, and Residual Stress applications. It doesn’t matter whether data have been collected with 0-D, 1-D or 2-D detectors.
The GUI can be customized to accommodate the requirements of both scientific researchers and industrial operators.

Joint evaluation of multiple XRR, HRXRD, GISAXS and RS measurements
Advanced X-ray scattering theories and numerical methods for estimation, simulation and fitting of data in direct and reciprocal space
Naturally integrated processing of the 1- and 2-dimensional data sets measured by point, line and two-dimensional detectors
Universal sample model editor for parameterizing any type of thin film and bulk samples
Comprehensive and extendable material database covering all 230 crystallographic space groups
Area mapping tool for display and evaluation of the measurements performed over large sample areas
Advanced sin²ψ method for Residual Stress analysis of 1-D and 2-D data, as well as the multiple (hkl) method of evaluating the stress gradient in polycrystalline coatings

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Eigenschaften

DIFFRAC.LEPTOS Modules

LEPTOS R

With LEPTOS R diffuse scattering rods and rocking curves can be fitted both as a separate curve and as a consistent set of several curves in any combination of transverse and longitudinal scans.

LEPTOS R is designed for the analysis of X-ray Reflectivity (XRR) data and off-specular Diffuse Scattering (DS) from thin layered structures. The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the R module inherits all the functionality common for the whole package.

LEPTOS R has been highly rated in several international benchmarks, including the VAMAS project A10. The structure of LEPTOS R is compliant with the newly developed international rfCIF standard for the data format of XRR data.

LEPTOS H

LEPTOS H contains an Area Mapping module that makes it possible to treat HR-XRD data taken point-by-point over a large sample area and to display mappings of sample parameters.

LEPTOS H stands for High-Resolution X-ray Diffraction and Grazing-Incidence X-ray Diffraction data analysis.

The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the H module inherits all the functionality common for the whole package.

LEPTOS S

Residual stress gradients can be calculated from multiple {hkl} measured at different grazing-incident angles. The absorption and refraction of X-rays, as well as the coating thickness, are taken into account for the calculation.

LEPTOS S is an innovative, powerful and comprehensive module for the analysis of Residual Stresses measured by 0D, 1D or 2D detectors by use of classic sin2ψ and extended XRD2 methods. The module is fully integrated in the LEPTOS suite and inherits all the functionality common for the whole package.

LEPTOS G

LEPTOS G allows the integration of 2D data into fitable 1D datasets as well as transformation of 2D data between laboratory and reciprocal space coordinates.

LEPTOS G makes an evaluation of Grazing-Incidence Small-Angle Scattering data, measured from the samples containing nanoscale particles embedded within the undersurface region or located on the surface of sample. These can be, for example, buried or surface semiconductor quantum dots and islands, porous materials, condensed powder, embedded in polymers nanoparticles, etc. The license for module G includes also R module for X-ray Reflectivity.