NanoWizard 4 XP NanoScience

The NanoWizard 4 XP NanoScience is equipped with a range of new features, including:

• PeakForce Tapping®for easy imaging
• Fast Scanning optionwith up to 150 lines/sec
• NestedScanner Technologyfor high-speed imaging of surface structures up to 16.5µm with outstanding resolution and stability
• New tiling functionalityfor automated mapping of large sample areas
• V7 Softwarewith revolutionary new workflow-based user interface
• DirectOverlay™ 2 softwarefor perfect integration and data correlation with advanced fluorescence microscopy platforms
• Vortis™ 2 controllerfor high-speed signal processing and lowest noise levels

PeakForce Tapping provides superior force control and an uncomplicated setup, no matter what the sample or environment. No expert knowledge or cantilever tuning is necessary.

It enables precise control of probe-to-sample interactions and minimizes imaging forces, thereby protecting your tip and ensuring consistent, long-term, high-resolution imaging.

The fastest and easiest way to navigate is to see where you want to go.DirectOverlay 2provides instant navigation, with direct selection of measurement positions anywhere within the scanner range. The Motorized Precision Stage and HybridStage™ free experiments of the lateral constraints of the AFM piezo range, and allow direct motorized movement to selected positions.

The newDirectTilingfeature automatically creates a large optical overview to accelerate this process. Multiscan enables tiling of high-resolution images to build up a comprehensive overview of the sample. Repetitive or complicated measurement sequences can be automated usingExperimentPlanner™macros.

The images show PDMS stamped surface pattern, sample courtesy of Dr. Claudio Canale, University of Genoa, Italy. [1] Optical image of reference pattern. Four square regions are marked with a concentric corner pattern, the inner corners form a 50 micron square with test patterns printed in the center, but not visible in the optics. Imported into the SPM software with DirectOverlay, such images allow single-click navigation between reference positions separated by many times the piezo range. QI Advanced images of two such reference patterns (see arrows), topography [2] + [4] and adhesion images [3]+ [5].

The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK'sQI™-Advancedmode capabilities make this easy and straight forward. The NanoWizard 4 XP NanoScience system is supported by a comprehensive range of modes and accessories, each designed for easy handling and to meet the individual needs of researchers. Many experiments investigating material properties, including electrical properties, benefit from working in an enclosed cell to measure under a controlled inert gas atmosphere.

Characterization of material properties

• Mechanical properties (elasticity, stiffness, adhesion, deformation)
• Electrical properties with Electrical Force Microscopy, Conductive-AFM, Kelvin Probe AFM (KPM), Scanning Tunneling Microscopy (STM)
• Magnetic properties with MFM
• Electro-optical properties with photo-conductive AFM
• Local thermal properties by scanning thermal AFM
  

In-Situ AFM while applying external loads to change sample properties

• Piezoresponse Microscopy with high Voltages (PFM)
• Observe samples under external load with the StretchingStage
• Apply external magnetic fields
• Electrochemistry and scanning electrochemistry (SECM)
  

Sample environmental control options

• Sample heating from ambient to 300°C
• Sample cooling from ambient to – 35°C
• Cryo-AFM down to – 150°C with the CryoStage
• Defined sample humidity
• Perfect for experiments in fluids even harsh fluids
• Experiments with controlled gas flow
• Experiments in demanding environments in a glove box
  

• Fast Scanning optionwith up to 150 lines/sec for tracking dynamic processes
• Now with Bruker’s exclusive PeakForce Tapping as standard
• Large scan field of 100 × 100 × 15 µm³and atomic lattice resolution on inverted microscopes
• New workflow-based user interfacefor ergonomics and ease of operation
• New tiling functionalityfor automated mapping of large sample areas together with the HybridStage
• New Vortis 2 controllerwith high-speed low-noise DACs and cutting-edge position sensor readout technology
• Highest flexibility and upgradeabilitywith a broad range of modes and accessories
  

Standard Operating Modes

Imaging modes

• Now with PeakForce Tapping
• Contact mode with lateral force microscopy (LFM)
• Tapping Mode™ with PhaseImaging™

Force measurements

• Static and dynamic spectroscopy
• Advanced force mapping

• Higher harmonics imaging
• Kelvin Probe Microscopy and SCM MFM and EFM (see also QI mode)
• Conductive AFM (see also QI mode)
• STM
• Electrical spectroscopy modes
• Piezoresponse Microscopy for high voltages
• Electrochemistry with temperature control and optical microscopy
• NanoLithography
• NanoManipulation
• Nanoindentation
• Scanning Thermal AFM
• FluidFM® solution from Cytosurge
• ExperimentPlanner for designing a specific measurement workflow
• RampDesigner™ for custom designed clamp and ramp experiments
• ExperimentControl feature for remote experiment control
• DirectOverlay 2 for combined AFM and optical microscopy
• Additional XY or Z sample movement stages available with CellHesion®, TAO™ and HybridStage™ module
  

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. Bruker provides you with the right accessories to control your sample conditions and to perform successful experiments.

The new V7 software interface guides users through the workflow to set up experiments intuitively and makes it simple, even for users with minimal AFM experience, to progress confidently to generating high-quality data. Each stage of the setup and operation works as an optimized desktop that brings all the vital information into focus with a single click.

• On-screen, context-sensitive help
  
• Status feedback for alignment and setup
• Efficient task-based experiment selection
• Fast access to favorite and recently used experiments
• One-click probe calibration
• Instant overview of the key data
• User management for Multi-User environments like imaging facilities