Hysitron PI 85E
ハイライト
Hysitron PI 85E SEM PicoIndenter
The Hysitron PI 85E SEM PicoIndenter extends the range of your in-situ mechanical testing, bridging the gap between nanoscale and microscale characterization. This depth-sensing nanomechanical test system is specifically designed to leverage the advanced imaging capabilities of scanning electron microscopes (SEM, FIB/SEM, PFIB) while simultaneously performing quantitative nanomechanical testing. Its extended force range enables researchers to accurately test dimensionally large and/or hard structures that require larger loads to induce failure and/or fracture. The PI 85E instrument offers indentation, compression, tension, and fatigue testing across the entire materials spectrum (from metals and alloys to ceramics, composites, and semiconductor materials). The compact, low-profile architecture of PI 85E makes it ideally suited for small-chamber SEMs, Raman and optical microscopes, beamlines, and more.
特長
Nanoindentation: High-Precision In-Situ Mechanical Testing
Characterize hardness, creep, stress relaxation, elastic modulus, and fracture touhgness of near-surface features, interfaces, localized microstructures, and thin films.
Behavior Exploration with Extended Range
Hysitron PI 85E incorporates a variety of testing modes to characterize fundamental mechanical properties, stress-strain behavior, stiffness, fracture toughness, and deformation mechanisms across a wide range of samples. In addition to Bruker's industry-standard testing transducer, PI 85E offers higher load (250 mN) and larger displacement (150 µm) capabilities. The high-bandwidth transducer and flexure with advanced control electronics fully optimize large-scale sample testing and provide exceptional performance and sensitivity.
Characterization of One-, Two- and Three-Dimensional Nanostructures
The Hysitron PI 85E system uses patentedPush-to-Pull (PTP)devices to characterize one-dimensional structures, such as nanowires and nanotubes, and two-dimensional structures, such as free-standing thin films. These structures can also be electrically characterized with the instrument's optional Electrical Push-to-Pull devices. The larger displacement range of PI 85E is also ideal for testing deformation of three-dimensional lattices to larger strain.
アクセサリー
ウェビナー
Watch our Recent Broadcasts on Nanomechanics in SEM
Our webinars cover best practices, introduce new products, provide quick solutions to tricky questions, and offer ideas for new applications, modes or techniques.