重金属s Analysis
XRF
Elemental Analysis of Heavy Metals Using XRF
Elevated concentrations of heavy metals are a known danger to all life forms. It is crucial to screen consumer products for their presence and to confirm their concentrations are below regulated levels in both natural and manufactured materials prior to use.
XRF is a fast, nondestructive technology for elemental analysis of heavy metals in a variety of materials. Bruker’sElemental Analyzer portfolioincludes high-throughput lab-basedED-XRFandWD-XRF, point-and-shoothandheld XRF,micro-XRF, and全反射x射线荧光(TXRF)spectrometers.
Portable XRFis ideal for screening any material for dangerous levels of heavy metals. Objects in all forms – liquids, solids, cores, powders, creams, shavings, chips – can be analyzed wherever they are located.
TXRFprovides the sensitivity of ICP-OES and AAS for heavy metal analysis at very low concentration levels without needing external calibrations or high maintenance costs. TXRF elemental analysis is a significantly faster and “greener” method than ICP.
Micro-XRFcan map the density distribution of heavy metals in materials to have a better understanding of where they accumulate. This technology is of particular importance when evaluating biological samples.