Materials Science Research

Nanomaterials

Scientists and engineers from biology, chemistry and physics gain deeper insights into the nanoscale cosmos, discover new possibilities, and create innovative products using Bruker solutions.

Analysis of Complex Systems on the Nanoscale

Understanding these and other complex systems on the nanoscale is crucial for the design process and for the never-ending endeavor of designing new products on ever smaller scales. Nanomaterials are matter with one or more dimension sized below 100nm. The development of many technologies and industry sectors rely on nanotechnology. It builds the bridge across many research fields, such as biology, chemistry, physics, and engineering. Thus, various well-established analytical methods are applied in nanomaterials research. As part of everyday products, nanomaterials are widely used in various consumer and industrial applications, such as: semiconductor devices, medicine, solar, cosmetic, construction materials, clothing, appliances, and food.

Related Products

Electron Microscope Analyzers

Bruker provides high performance analytical solutions for mapping chemical element distribution down to traces or single atoms as well as crystallographic orientation down to the nanoscale. These techniques include EDS on SEM, EDS on TEM and STEM, on-axis TKD, EBSD. These complementary techniques are fully integrated in one software to allow researchers to combine quantitative data. Bruker’s unique OPTIMUS™ TKD detector head enables crystal orientation mapping and imaging with at least 2nm effective spatial resolution at high speed and data quality while using less than 2nA probe current. These characteristics make OPTIMUS™ TKD the highest performance solution in the market for quantitative and qualitative characterization of nanomaterials.

EDS、WDS、EBSD、SEM Micro-XRF

FT-IR Research Spectrometers

For investigating the functionality of nano-structured material, especially the so-called novel meta-material, in different wavelength ranges, the FT-IR serves as a powerful tool as it can easily measure the bulk optical response in reflectance and transmittance modes. This technique is well-established in the photonic industry.

Laboratory FT-IR spectrometers

Materials Research AFMs

Quantitative nanomechanical analysis in conjunction with high-fidelity topographic measurements is one of Bruker’s methods of unraveling the function of complex materials. From modulus measurements in the mega- to gigapascal range, adhesion and frictional maps, calorimetric and electrical data, correlated nanoscale AFM, and Raman spectroscopy to three-dimensional morphological plots with sub-nanometer accuracy, Bruker has the AFM solution for your problem.

High-Resolution AFMs

PicoIndenters for SEM and TEM

作为世界领先的纳米机械测试系统ems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. Video capture from the microscope enables real-time monitoring and direct correlation of mechanical data to microscope imaging. With solutions designed to fit many of the microscope brands in use, you are sure to find one that is ideally suited to your research.

Nanomechanical Instruments

散射系统

小角X射线散射（SAXS）

0.1µm-1nm的颗粒分析和纳米材料表征

X射线衍射仪

X射线衍射

对晶态和非晶态粉末、块状材料和薄膜进行晶体结构分析、材料特性分析和相分析。