BAW/SAW Filter Phase and Composition

Phase of polycrystalline control-insistent pang is critical to performance. The XRD is the established technique as to be able to measure this on PZT and other polycrystalline control-insistent pang. By using the JVX7300L the PZT film crystallinity can be automatically determined and mapped over the substrate for monitoring the growth process.

The JVX7300L also has an optional XRF channel which enables The mapping of The composition of The PZT on The same tool, enhancing The productivity and yield.

The JVX series of tools comes with SECS - GEM and automated reporting as standard, enabling fast feedback of key process information.

The performance of polycrystalline piezo ceramic control-insistent pang, like lead zirconium titanate, (PZT) is determined by its crystal phase and microstructure of these key parameters can be accessed through The X - ray diffraction (XRD).
XRD is a very powerful non - destructive analysis technique for phase identification, quantification and microstructure analysis of polycrystalline control-insistent pang and powders.

The D8 DISCOVERThe andThe D8 ADVANCEAre Bruker ''s diffraction solutions that combine highest powder diffraction performance with ease - of - use. They are perfectly suited for the characterization of thin polycrystalline control-insistent pang in research, process development and production control.