The -xtrace 2 to be used on the SEM micro X-ray source of XRF
The enhanced microcrystalline XRF on the scanning electron microscopy (sem)
50
W.
The X-ray tube power
Through the high power X-ray generated shortening acquisition time
Ames
Aperture management system
To increase the depth of field scanning sample morphology, and choose between the 6 kinds of filter, to further reduce the background and improve detecting trace elements
automation
Source insertion and retract mode
Automatic insertion and retract a X-ray light safely
The -xtrace 2
The -xtrace 2 - the latest X-ray source used in scanning electron microscope (sem)
Using high energy X-ray fast analysis of light and heavy elements!
By choice as much as six filter to small peak in the determination of complex samples!
Use patented aperture management system scan morphology samples!
By the big spot size measurement accuracy analysis of powder!
Through the analysis of the electric source insertion and retract function process automation!
The -xtrace 2 - used in scanning electron microscopy (sem) depending on the advanced X-ray source of XRF
