VANTEC - 500 detector

VANTEC - 500 detector is the core of a new generation of 2 d XRD system technology, it combines classic x-rays and the advantages of the electronic X-ray single photon detector.It has more than 15000 mm squared large detection area, within a few seconds to capture with traditional film camera as much as 2 d information.It can "see" real-time and count a single photon, so as to realize the counting of excellence statistics.Due to the proprietary MIKROGAP ™ technology, VANTEC - 500 can work at high counting rate, and almost no noise at work.Cosmic rays and is the only source of background of natural radioactive, it in the whole detection area is only less than 5 CPS.Therefore, for analyzing samples of weak scattering and the strong scattering samples, it is very suitable.

MIKROGAP extremely stable detector is developed, no maintenance, is not sensitive to mechanical shock or sport, that can tolerate high strength, high energy radiation from being damaged.Thanks to the rich experience and internal work to research and develop the detectors, VANTEC - 500 will be exemplary, without any defect detection area.

In MIKROGAP detector, grille, anode, delay line and Xe - CO²Gas mixture with beryllium incident window contained in a sealed container.In the transition zone, the incident X-ray photons through the primary electron gas ionization.These electrons in high-voltage electrical fields to the anode.Electronic number multiplication in the gain clearance.Such a signal amplification is much bigger than any solid detector, thus it can be very weak signal is detected.Read the passage through the X and Y delay line locate each X-ray photons.MIKROGAP technology are the key features using resistive anode for extremely thin gain clearance, thereby greatly improving local count rate.

The successful application of 2 d XRD method, need to be in two aspects of hardware and software of intelligent integrated methods.

DIFFRAC. SUITE software provides the optimal measurement strategy.It can suggest the best Settings, to optimize the data acquisition of different diffraction geometry.For example, you can identify with similar in Debye view spots and texture of the Debye ring.Only with the same characteristics of Debye ring belong to the same phase.Use our unique "search/match" function to identify the crystalline phase.Other features include software

• 2 d XRD MEASUREMENT scheme and fully integrated planning function to DIFFRAC. The MEASUREMENT and DIFFRAC. The WIZARD
• DIFFRAC. TEXTURE support 2 d frame data, in order to generate a figure and orientation distribution function (ODF)
• DIFFRAC. LEPTOS fully support 2 d model is used to measure the residual stress

VANTEC - 500 hardware integration embodies the DAVINCI design principles

DAVINCI. MODE

• Instant registered components and all its specific features
• With functions of fault tolerance mechanism of positioning
• Automatic identification of detector distance

DAVINCI. SNAP - the LOCK- replace components don't need to use tools

• Easy and quick, do not need to tool
• Don't need to align
• The variable location along the orbit

DIFFRAC. DAVINCI

• Real-time identification of components and displays a status
• Detecting element missing, dislocation or inappropriate
• All fixed and mobile components parameterized