DIFFRAC. LEPTOS

Bright spot

Fully functional materials research software suite

X-ray reflectivity (XRR) can provide samples of vertical density distribution details, layer thickness and interfacial roughness.High resolution X ray diffraction (HRXRD) can measure the crystal structure of the sample.Grazing incidence small Angle X-ray scattering (GISAXS) nanoparticles can be used for analysis and porosity.Residual stress analysis of bulk sample can be detected and the strain state of the polycrystalline coatings.

In addition to the conventional single curve scanning, high resolution HRXRD LEPTOS can also analysis and XRR reciprocal space diagram, GISAXS stress test and XRD squared frame diagram, as well as the HRXRD, XRR and residual stress of site scans.With zero dimension, one-dimensional or two-dimensional detector data collected.

The graphical user interface can be customized to meet the scientific researchers and industrial operators different aspects of the requirements.

Conjoint analysis XRR, HRXRD, GISAXS and many measurements of the RS
Advanced X-ray scattering theory, and used to estimate, simulation, and the fitting is mathematical algorithm in space and the reciprocal space
By dots, lines and two-dimensional detector measured a peacekeeping two-dimensional integral processing data sets
General sample model editor that can be used for parametric any type of film and bulk sample
Comprehensive and extensible material database, covering all 230 crystal space group
Area much dot scanning tools, can display the test results and analysis of large sample area
Advanced sin squared bits method for residual stress analysis of the two kinds of data, at the same time there are many methods to analyze the stress gradient coating (HKL)

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The characteristics of

DIFFRAC. LEPTOS module

LEPTOS R

LEPTOS R can synthesize non-reflecting column and rocking curve fitting the curve of the independent, but also some curve fitting for horizontal and vertical scanning of a set of curves.

LEPTOS R is suitable for the analysis of X-ray reflectivity (XRR) data and the structure of the thin layers of diffuse scattering (DS) data.This module is fully integrated in the LEPTOS suit, can be used to analyze HRXRD, GISAXS and XRR data at the same time.As part of the LEPTOS suit, R modules have a whole set of common all functions.

LEPTOS R in many international benchmarking project (such as VAMAS project A10) won the high praise.LEPTOS R structure is in line with new XRR international rfCIF standard data format.

LEPTOS H

LEPTOS H contains more than one area dot scanning module, can be used to handle on the large sample area point of HR - XRD data, and display the sample parameters.

LEPTOS H can be used for analysis of high-resolution X-ray diffraction (XRD) and grazing incidence X-ray diffraction data.

This module is fully integrated in the LEPTOS suite, can be used to analyze HRXRD, GISAXS and XRR data at the same time.As part of the LEPTOS suite, H module have a whole suite of common all functions.

LEPTOS S

Can pass under different grazing incidence Angle measuring {HKL} more data to calculate the residual stress gradient.Should be considered when calculating X-ray absorption and refraction, and coating thickness.

LEPTOS S is an innovative, powerful and comprehensive tools, applicable to the analysis using the classical sin2 bits of method using zero dimension, one-dimensional or two-dimensional detector test and expand XRD2 method of the residual stress of the test.The module is fully integrated in the LEPTOS suit, have the entire suit all common functions.

LEPTOS G

LEPTOS G can integral 2 d data fitting method for one dimensional data, and 2 d data in the laboratory can be coordinate and reciprocal transformation between the spatial coordinates.

LEPTOS G is suitable for the analysis of small Angle scattering grazing incidence data, the data from the sample containing nanoparticles, these particles may be below the surface or on the sample surface.For example, these can be embedded or on the surface of the semiconductor quantum dot and island, porous materials, agglomerated powder, embedded in the polymer nanoparticles, etc.Authorization module G also contains the X-ray reflectivity R module.