NANOSTAR

NANOSTAR unparalleled modular characteristics, it is through a small Angle X-ray scattering (SAXS), swept into the small Angle X-ray scattering (GI - SAXS), wide Angle X-ray scattering (WAXS) and Nanography, for characterizing the structure and nano structure on the surface of the ideal tool.Support mirror adjustment of pinhole collimation system provides a high strength and low parasitic scattering parallel wiring harness, and keep the ideal circular beam shape.Large (XL) sample room can accommodate a variety of special sample stage and the third party sample table, under any condition, so that you measured on various types of samples.Finally, you will be able to pass big background, highly sensitive, low 2 d detector, collect samples of isotropic and anisotropic scattering signal.

This unique X-ray source without water, can provide very stable high strength point focusing X-ray beam.Thanks to its rugged design, the gamma ray source with 3 years warranty.I (including S contains MONTEL integration, advanced 2 d beam plastic optical device, can achieve the highest intensity on the sample.The multilayer reflector design side by side can capture gamma ray source sent out large solid Angle x rays, and effectively in the highly parallel monochromatic beam redirect.

Using Mikrogap^TMTechnology VANTEC - 500-2 - D detector can be ideal to meet all the requirements of special SAXS system.First of all, no gas, water or routine maintenance, you also need not worry about radiation damage or movement, therefore, the probe is very strong and easy to use.Large effective area (14 cm in diameter), which can realize large Angle coverage, at the same time bring full field of vision.Very low background and high count rate, the biggest can achieve good dynamic range, and is very sensitive to the sample of weak scattering.Good spatial resolution, can solve the problem of small spacing scattering.At present, there is no other detector can provide this kind of ideal for the application of the function of the combination.

Small Angle X-ray scattering (SAXS) is embedded into the phenomenon caused by different electron density of particles in the matrix.If particle size between 1 nm - 200 nm, the scattering Angle in the range of 0 ° to 5 °, depending on the use of X-ray wavelength.The smaller the particle, the greater the scattering Angle.

In any medium, any particle arrangement shows the difference of electron density, in the SAXS experiments, this results in a specific pattern.In addition to the particle size, SAXS can also identify the shape, distance and particle size distribution of 2 d graphics.Particles can be dissolved macromolecule, metal precipitation, biological tissue of mineral particles and surfactant micelle.

Compared with the SAXS, wide Angle X-ray scattering (WAXS) identification is the Angstrom level structure, is usually a crystal structure of planar spacing.WAXS is typically used for analysis of Prague, X-ray diffraction (XRD), which helps confirm crystal structure, crystallinity, crystallite size and phase composition (ID).Just put the second detectors in a more close to the location of the sample, can be in WAXS data collected at the same time, obtain SAXS data.

In Nanography study, using the integration in the NANOSTAR electric machine x-y sample in sample room.Therefore, you can through the X-ray beam to automatically scan samples of the selected area.Then, can through the outline color code, to show the strength distribution of the scattering parameters (or other) information.

Nanography test non-uniform samples quickly and selectively related measurement point, can even pinpoint smaller samples.Complete Nanography said every measurement point of 2 d image collected SAXS/WAXS integral strength.