The D8 ADVANCE ECO

D8 ADVANCE ECO is a fully functional D8 ADVANCE economical version of diffraction instrument, is platform D8 diffraction series of introductory paragraph.As procurement and maintenance of the X ray analysis of increasingly limited resources, people demand for accuracy, precision and speed also reached an unprecedented height.

D8 ADVANCE ECO is the ideal solution: minimum of performance, ease of use and good ecological footprint analysis is its most prominent characteristics.Thanks to streamline the instrument configuration, no matter how the budget, it is your ideal choice.

And D8 ADVANCE a series of other products, the D8 ADVANCE ECO cover all X-ray powder diffraction and scattering applications, including

• Typical X-ray powder diffraction (XRD)
• Analyzing the distribution function (PDF)
• Small Angle X-ray scattering (SAXS) and wide Angle X-ray scattering (WAXS)

Environmental conditions and the environmental conditions.

D8 ADVANCE ECO and D8 ADVANCE fully compatible, so have all the flexibility for the future.In the face of new applications, you can easily upgrade to its, at any time to adapt to the future possible any X-ray diffraction and scattering application.

D8 ADVANCE ECO can offer high brightness 1 kw line focus X-ray source, its energy consumption is extremely low, without peripheral water, there is no special requirements for laboratory infrastructure.You only need to prepare household wall socket.Therefore, you will be able to simple and quick to complete the installation and location.The D8 ADVANCE ECO将在分析性能不打折扣的前提下，将拥有成本和立式XRD仪器的生态足迹降至最低。

Plug-in analysis:

• Without a peripheral water: can save up to 1.700 m3 of water every year
• Power consumption reduced by 50% or so
• It takes only a single-phase power supply

No matter what your budget, D8 ADVANCE ECO series can through the instrument configuration to bring you high performance.Due to reduced demand for water and electricity resources, its operation cost is reduced greatly.Excellent equipment quality guarantee for the reliability, brooke also provide unparalleled component for quality assurance.

• No external water supply cost
• 1 kw high efficient generator significantly reduce electricity costs, no external power of the cooler
• Greatly prolong the service life of the X-ray tube
• X ray tube quality assurance: the D8 ADVANCE ECO available all high brightness X-ray sources have 3 years warranty
• Goniometer warranty: goniometer using strong maintenance-free design, can bring you the biggest mechanical strength and longer service life, thus able to provide you with excellent data quality.Among them, the brook provide 10 years warranty.
• Instrument collimation
• The probe quality assurance

X-ray powder diffraction (XRPD) technology is one of the most important material characterization tool.Powder diffraction figure a lot of information, directly from the phase arrangement of atoms.In the D8 ADVANCE and DIFFRAC SUITE software support, you will be able to implement common simply XRPD method:

• Identify the crystal phase and amorphous phase, and the determination of purity of samples
• For multiphase mixture of crystal phase and amorphous phase quantitative analysis
• Microstructure analysis (crystallite size, micro strain, disorderly...).
• Heat treatment or processing and manufacturing components of a large number of residual stress
• Texture analysis (preferred orientation)
• Index, from the crystal structure and crystal structure refinement

Thin film and coating analysis using the principle of the same as the XRPD, but further provides the Angle of beam adjustment and control function.Typical examples include, but are not limited to phase identification, crystal quality, residual stress, texture, thickness and composition and the strain analysis.The analysis of thin film and coating, of thickness between the nm and including m analyses characteristics of layered materials, from amorphous and polycrystalline coatings to epitaxial film, etc.The D8 ADVANCE and DIFFRAC SUITE software high-quality film can make the following analysis:

• Grazing incidence diffraction
• X ray reflection
• High resolution X ray diffraction
• Reciprocal space scanning