The D8 ADVANCE Plus

D8 ADVANCE Plus is D8 ADVANCE another version, is a multi-purpose, multi-user laboratory platform for the ultimate version of X ray.It is ideal to meet your demand for all types of sample, including powder, block material, fiber, sheet and film (amorphous, polycrystalline and extension) :

• Typical X-ray powder diffraction (XRD)
• Analyzing the distribution function (PDF)
• Small Angle X-ray scattering (SAXS) and wide Angle X-ray scattering (WAXS)
• X-ray reflectivity (XRR) and high resolution XRD (rocking curve, reciprocal space scanning) environmental conditions and environmental conditions

One of the advantages of this system is that it can be in as many as six different switching between beam geometry: focus from Brentano used for powder Bragg geometry for epitaxial film of high resolution parallel beam of alpha 1 K geometry as well as the switching between the two.You just need to press the button, the software is in our hands.

No matter you are using the sample of the types and want what applications, whether you are a novice user or expert users, are suitable for this: the D8 ADVANCE Plus has unmatched flexibility and ease of use, in terms of data quality, set a new benchmark.

Patented for any partial or the operation of the light path, simplifies the D8 ADVANCE, make it suitable for a variety of applications and sample types.For convenience of users, the system provides the function of automatic electric switch, can be in as many as six different automatically switch between beam geometry.Without human intervention, system in three light path switching between:

• Used for the analysis of the powder Bragg - Brentano focusing geometry
• Used in capillary, GID and XRR high strength parallel beam of alpha 1 K, 2 geometry
• Used for high resolution parallel beam epitaxial film alpha 1 K geometry

It is very suitable for the environmental conditions or environmental condition to analyze samples of all types, including powder, block material, fiber, sheet and film (amorphous, polycrystalline and extension).

EIGER2 R with multimodal functions (0 d d - 1-2 d, snapshot and scanning mode), covered from powder research materials from a variety of measurement methods.EIGER2 is not in the traditional sense of the tiger balm, but all the experts in the field of analytical applications.It can be realized without absorption measurement dynamic range, is used for super fast powder and reciprocal space quickly scan the 1 d large size and more than 500 k pixel of 2 d large coverage, and the multiple pattern detector set a new standard.EIGER2 adopted DECTRIS company research and development of beam detector technology, integration of the software and hardware of the brook, will eventually bring you seamless and easy solution.

X-ray powder diffraction (XRPD) technology is one of the most important material characterization tool.Powder diffraction figure a lot of information, directly from the phase arrangement of atoms.In the D8 ADVANCE and DIFFRAC SUITE software support, you will be able to implement common simply XRPD method:

• Identify the crystal phase and amorphous phase, and the determination of purity of samples
• For multiphase mixture of crystal phase and amorphous phase quantitative analysis
• Microstructure analysis (crystallite size, micro strain, disorderly...).
• Heat treatment or processing and manufacturing components of a large number of residual stress
• Texture analysis (preferred orientation)
• Index, from the crystal structure and crystal structure refinement

Thin film and coating analysis using the principle of the same as the XRPD, but further provides the Angle of beam adjustment and control function.Typical examples include, but are not limited to phase identification, crystal quality, residual stress, texture, thickness and composition and the strain analysis.The analysis of thin film and coating, of thickness between the nm and including m analyses characteristics of layered materials (from amorphous and polycrystalline coatings to epitaxial film).The D8 ADVANCE and DIFFRAC SUITE software high-quality film can make the following analysis:

• Grazing incidence diffraction
• X-ray reflection method
• High resolution X ray diffraction
• Reciprocal space scanning