The D8 DISCOVER
Which has the best performance of XRD
Bright spot
D8 DISCOVER is the flagship of the multi-function X-ray diffractometer, with many frontier technology components.It specially designed for the environmental conditions and environmental conditions, from the powder, amorphous and polycrystalline material to denotation multilayer film and other material designed for structural characterization.
Scope of application:
- Qualitative analysis and quantitative analysis, structure determination and refinement, analysis of micro strain and crystallite size
- X-ray reflection method, grazing incidence diffraction (GID), in-plane XRD diffraction, high resolution, GISAXS, GI stress analysis, crystal orientation analysis
- Residual stress analysis, texture and polar diagram, micro area, X-ray diffraction (XRD), wide Angle X-ray scattering (WAXS)
- Total scattering analysis: Bragg diffraction, the distribution function (PDF), small Angle X-ray scattering (SAXS)
The market situation
Automotive and aerospace
Semiconductor and microelectronics
The pharmaceutical industry screening
Energy storage/battery
drug
geology
metal
Thin film measurement
The characteristics of
The main features
I (including micro JiaoYuan S
Equipped with MONTEL micro optics (including I S JiaoYuan X-ray beam can provide high strength is small, very suitable for small range, or the study of the sample.
- Mm the size of the beam, high brightness and low background
- Green design: low power consumption, water consumption, prolong service life
- MONTEL optics beam shape and emittance can be optimized
- With brooke components, optical devices and detector is fully compatible with.
Ucm sample units
D8 DISCOVER offers many ucm platform, has the incomparable sample scanning and weight capacity:
- Can scan for the weighing 5 kg of sample
- The sample of the large area mapping: biggest 300 mm
- Samples of ucm support high-throughput screening (HTS), maximum three orifice.
Given its highly modular performance, the ucm sample sets can be beyond the standard according to the requirements of customers customized.
The multimode EIGER2 R detector
EIGER2 R 250 k and 500 k is bringing Synchrotron performance to lab 2 d detector of X ray diffraction.
- Advanced sensor design, including the second generation of revolutionary EIGER: maximum size is 75 x 75 mm squared 500000 pixels, it can realize the micro resolution of macro coverage.
- Ergonomic design: can be easily according to the application requirements, adjust the position and direction of detectors, including 0 ° 90 ° / free tool position detector switch and can change continuously, support automatic light.
- Panoramic optical devices and accessories, eye shot is open.
- 0 d, 1 d and 2 d operation mode: support snapshot, step by step, continuous or advanced scanning mode.
- But with DIFFRAC. SUITE seamless integration.
For any partial or called and PATHFINDER PLUS called
Patented for any partial or optical device can automatically switch between three types of light path:
- Used in powder Bragg - Brentano focusing geometry
- Used for capillary, GID, and the analysis of the XRR high strength parallel beam of alpha 1 K, 2 geometry
- Used for high resolution parallel beam epitaxial film alpha 1 K geometry
PATHFINDERPlusOptical device with a to ensure that measured the strength of linear automatic absorber, and can switch between the following:
- Electric slit: for high flux measurement
- Spectral crystal: used for high resolution measurement
Use equipped with price and PATHFINDERPlusThe D8 DISCOVER without reconfiguration, under the condition of the environment or environmental conditions, including powder, block material, fiber, sheet and film (amorphous, polycrystalline and extension), the type is in our hands.
The D8 goniometer
Turbo X-ray source (TXS)
MONTEL optics
application
Advanced X-ray diffraction (XRD)
Thin film analysis
X-ray diffraction (XRD) and reflectivity is important for characterizing the condition of thin layer structure of the samples.The D8 DISCOVER和DIFFRAC.SUITE软件将有助于您使用常见的XRD方法轻松进行薄膜分析：
- Grazing incidence diffraction (GID) : phase sensitive surface identification and determination of structural properties, including the crystallite size and strain.
- X-ray reflectivity measurement (XRR) : used to extract from the simple to the highly complicated superlattice layers of sample thickness, material density and interface structure information.
- High resolution X ray diffraction (HRXRD) : for: analysis of epitaxial layer thickness, strain, relaxation, Mosaic, mixed crystal composition analysis.
- The stress and the analysis of texture (preferred orientation).
Materials research
Material can be studied by XRD structure and physical properties, is one of the most important materials research tools.The D8 DISCOVER就是布鲁克推出的、用于材料研究的旗舰款XRD仪器。D8 DISCOVER配备了技术领先的组件，可为您带来最佳的性能和充分的灵活性，同时让研究人员对材料进行细致入微的表征：
- Qualitative analysis and structure determination
- Micro strain and crystallite size analysis
- Stress and texture analysis
- Particle size and particle size distribution measurement
- Using micron-sized X-ray beam local XRD analysis
- Reciprocal space scanning
Screening and large area scanning
Involved in high-throughput screening (HTS) and large area scanning analysis, D8 DISCOVER is the best solution.And with ucm samples of blessing, D8 DISCOVER became the electric displacement and similar weight ability best:
- Orifice plate and sediment samples in the reflection and transmission of high-throughput screening (HTS)
- The maximum scanning the sample 300 mm
- Install and scan the weight not more than 5 kg of sample
- Automation interface
Range of application
The residual stress analysis
Using the 2 d detector (including XRD
Qualitative phase analysis
High-throughput screening (HTS)
The environment of XRD
Small Angle X-ray scattering (SAXS)
Wide Angle X-ray scattering (WAXS)
Texture analysis
X-ray reflectivity measurement (XRR)
High resolution X ray diffraction (HRXRD)
The chip and scans the area
Reciprocal space scanning
Technical parameters
The D8 DISCOVER specifications
| specifications | advantage | |
| TWIST - TUBE | Easily switch between focus point and line focus Anode material available: Cr, Cu, Mo, Ag The highest power and filament: 3 kW, depends on the anode material (0.4 x 16 mm squared) Patents: EP 1 923 900 B1 |
Rapidly changing wavelength to ideal to match different applications Can the fastest speed online fast switching between focus and focus point, thus expanded the application scope, and can be in a shorter period of time, get better results. |
| I (including micro JiaoYuan S | The highest power load: 50 W, single phase power MONTEL and MONTEL Plus optics: combines the parallel lens and focus lens Beam size: as low as 180 x 180 (including m squared Mirror export biggest fluence: 8 x 10 ⁸ CPS Low beam divergence: 0.5 mrad |
Mm the size of the beam, high brightness and low background Green design: low power consumption, water consumption, longer service life To optimize the shape and divergence, to achieve the best results |
| Turbo X-ray source (TXS) | Focus: 0.3 x3mm squared Brightness: 6 kW/mm squared Anode materials: Cu, Co, Cr, Mo Maximum 50 kV voltage, power depends on the anode material: Cr: 3.2 kW.Cu/Mo: 5.4 kW.Co: 2, 8 kW Advance on tungsten filament |
Strength is 5 times of the standard ceramic X-ray source. Is the line focus and the focal point of point application of ideal Preliminary alignment of the filament to support rapid change, greatly reduced the demand for at. |
| For any partial or called | Software switch button: Electric divergence slit (Bragg - Brentano) High strength Ka1, two parallel beam High resolution Ka1 parallel beam Patents: US10429326, US6665372, US7983389 |
Can be in as many as six different automatic electric switch between beam geometry, without human intervention Is ideal for all types of samples, including powder, block material, fiber, sheet and film (amorphous, polycrystalline and extension) |
| High resolution monochromator | Symmetry in geometry and asymmetric geometry Ge Ge (004) (220) and reflection 2 - b and 4 - (Bartels type b) monochromator Use the SNAP LOCK technology, aim to avoid the installation |
In terms of optimum resolution and strength balance, provide wide selection for you, help you to get the best results Can be replaced rapidly monochromator, optimized for different samples |
| The D8 goniometer | With independent double circle of step motor and optical encoder goniometer | Brooke unique collimating guarantee, ensure the accuracy and precision of unparalleled Absolutely free maintenance drive/gear, lubrication for life |
| Ucm sample units | The sample machine series X, y: largest mobile + / - 150 - mm samples Z: largest mobile 50 mm Phi: rotation is not restricted Psi: 55 ° slope top Maximum load weight (center) : 50 kg |
In terms of sample's weight and size, has incomparable advantages The implementation of the large-scale customized sample room can be realized |
| Centric Eulerian Cradle (CEC) | Sample machine: five degrees of freedom X, y: + / - 40 mm samples Z: highly aligned Phi: 360 ° rotation Psi: - 11 ° to 98 ° The highest load weight: 1 kg Provide all kinds of sample machine accessories. |
When lateral tilt, the measurement of stress and texture, in order to get higher accuracy. (x, y) : automatic mapping function. Electric tilting table: surface can be adjusted accurately. Powder or capillary rotator: can be used for powder diffraction. Bayonette sample machine: support can be rapid and repeatable swaps with other sample. |
| Pathfinder Plus called | Software switch button: Electric slit 2 - b Ge analysis crystal Integrated automatic absorber |
Can be automatic between two different optical device on the electric switch, without human intervention. Keep the LYNXEYE detector full field of vision. Use of absorber, ensures that the linear measurement data. |
| LYNXEYE XE - T | Energy resolution: 8 KeV, < 380 eV Test mode: 0 d, 1 d and 2 d Wavelength: Cr, Co, Cu, Mo and Ag Patents: EP1647840, EP1510811, US20200033275 |
Don't need to decide K filters and secondary monochromator Iron radiation can be 100% filter fluorescence 450 times faster than conventional detector system Bragg2D: use the divergence of the primary data collected 2 d wiring harness Unique detector warranty: no bad delivery channels |
| EIGER2 | Dectris ltd. developed based on mixed photon counting technology of a new generation of detectors, support for multiple model (0 d / 1 d / 2 d). | In step-by-step scanning, continuous scanning and seamless integration in the advanced scanning mode 0 d, 1 d and 2 d test. Ergonomic from probe rotating function, can optimize the gamma or 2 Ɵ Angle range Use full detector, free tools panoramic view of the diffraction beam optical systems Continuous variable detector position to balance the Angle range and resolution |
| The environment | Temperature: the range from 4 K ~ to ~ 2500 K Pressure: 10 - ⁴ mbar to 100 bar Humidity: 5% to 95% |
Under the condition of the environment and the environment in the investigation Sample units with DIFFRAC. DAVINCI, easily replaced |
accessories
XRD components
Bruker XRD solution contains a series of high-performance components to meet the demand of analysis.Modular design is the key to make the best instrument.
All kinds of components are brooke component part of the core competitiveness, they are made from brooke AXS development or, or by close cooperation with the third party suppliers.
Brooke XRD components can be used to upgrade the existing X-ray system, is used to improve its performance.
software
webinar
For more information
The D8 DISCOVER resources
Brochures, flyers and laboratory report
Instructions, reports, and the product table
- XRD analysis: fast the drug use EIGER2 R 500 k a snapshot of the 1 d and 2 d pattern
- By RSM analysis: mass use EIGER2 R 500 k InxGa1 - LED, GaAs and Si1 xN - xGex epitaxial film analysis
- Using EIGER2 R 500 k for mu XRD analysis in the field of geology, Georgia Graves Mountain Lazulite in situ studies
- Using EIGER2 R 500 k for residual stress analysis: polycrystalline tungsten coating on silicon 0 d, 1 d and 2 d research
- Using EIGER2 R 500 k and DIFFRAC. TEXTURE TEXTURE analysis: rolling aluminum sheet and aluminum sheet was studied
- Have I mu, mu XRD phase scanning S D8 DISCOVER
- Have I mu S micro JiaoYuan D8 DISCOVER: in-plane grazing incidence diffraction (IP - GID)
- Have I mu S high brightness micro JiaoYuan D8 DISCOVER: X ray diffraction
- Have I mu S high brightness of the micro JiaoYuan D8 DISCOVER: powder diffraction
- With PILATUS3 R of 100 k - A D8 DISCOVER: film 2 d RSM
- With PILATUS3 R of 100 k - A D8 DISCOVER: 2 d GI - SAXS
- With PILATUS3 R of 100 k - A D8 DISCOVER: quartz monzonitic XRD2 YanWei area
- Using A D8 PILATUS3 R 100 k - A DISCOVER: polymer XRD2
- Using A D8 PILATUS3 R 100 k - A DISCOVER: XRD2 texture analysis
- Using A D8 PILATUS3 R 100 k - A DISCOVER: XRD2 residual stress analysis
- The Universal Motion Concept and Eulerian Cradles: control samples
- Apply to the D8 series EIGER2 R
support
Service and support
We offer:
- Professional senior technical personnel to do fault professional technical support, isolation and solve the problem of hardware and software
- Network remote service, providing diagnosis and application support
- Fusion reality support - virtual engineers in your side,video)
- According to your request to schedule maintenance
- Customer site maintenance, maintenance services
- Spare parts delivery will be within one working day/the world needs a few working days to complete
- Installation qualification and operational qualification/performance verification of compliance services
- Site planning and relocation
- Find nextA training course
Check out ourSupport site:
- Software updates
- Product manuals and installation guide
- Training video
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