EIGER2 R detector
Bright spot
A new generation of HPC detector, apply to the most powerful XRD platform
EIGER2 R 250 k and 500 k is an easy-to-use multimode (0 d / 1 d / 2 d) detector, apply to the D8 ADVANCE and D8 DISCOVER diffraction series.
The mix of photon counting (HPC) detector based on second generation Dectris synchrotron EIGER revolutionary technologies.Large 2 d area contains 75 x75 including m2Pixels, it can realize high resolution wide coverage.Double energy threshold and high dynamic range help to accurate measurement of weak signal and the strong signal is the same.Brooke will EIGER2 seamless integration to DIFFRAC. The SUITE architecture, and ergonomic design of probe base and special parts, a powerful solution is simple and easy to use.
From powder diffraction to material research and application, the users can make full use of various measurement methods in the probe's outstanding features.EIGER2 not generalists generally, but the master of all kinds of application:
The new EIGER2 R 250 k sensors, with a square more than 250000 pixels, the perfect size for powder diffraction and the different spatial map super fast data acquisition.It's the high dynamic range makes to measure the film without the need for absorber HRXRD and XRR.
EIGER2 R 500 k has 500000 pixels, for rapid and environment experiment and fast pair distribution function analysis provides more than 1000 channels, large coverage of 2 d implementation including SAXS, texture and micro area diffraction experiment.
The characteristics of
The key features
advantage
Key benefits
Multimode detector
EIGER2 seamless integration to DIFFRAC. The SUITE architecture: 0 d, 1 d and 2 d data acquisition mode of implementation, and advanced step by step, continuous and consistent measurement type.Our patented algorithm can ensure data quality, best offer undistorted two-dimensional scanning data, without any disconnection.
EIGER2 can efficiently support various data acquisition strategy, allowing the user to obtain the best diffraction data of each sample type:
- 0 dSuitable for rough surface, polycrystalline coatings and epitaxial film samples
- 1 d modelSuitable for powder super quick scan, using the reflection (Bragg - Brentano) or transmission diffraction geometry measure, and for reciprocal space mapping epitaxial film
- The 2 d modelSuitable for a small amount of samples, preferred orientation or big grain materials, used in micro and texture mapping and used for stress analysis
Unique ergonomic design
No matter what you need is big 2 theta - scan coverage for powder diffraction snapshots, or a wide range of gamma texture measurement, no matter you wish to capture most of the diffraction beam SAXS/WAXS, still need very high angular resolution to disperse intensive peak - using EIGER2 only a short time can optimize the instrument Settings.
Thanks to Universal Detector base upgrade the clever design of the (Universal Detector Mount Plus), to change the probe orientation and samples need for tools to probe the distance, thus it can be quickly switch between different applications, and will not reduce the data quality:
- Light and compact design integrates real-time recognition of detector orientation and installation accessories
- Implements the fault-tolerant mechanism, probe rotates without alignment, can be optimized in a few seconds, gamma and 2 theta Angle coverage - available scanning type will automatically adapt to the probe orientation
- Continuous variable within the range of 100 mm to 500 mm probe position, D8 DISCOVER have automatic distance calibration function - both angular coverage and resolution has never been so easy.
Special optical element
Specially designed for EIGER2 panoramic view of the diffraction beam optical element, the need for tools, can use the full detector.These optical components with magnetic installation mechanism, have real-time DAVINCI component function.These parts are a good complement to EIGER2 testing solution, can minimize parasitic scattering or other adverse effects, such as 0 d and 1 d diffraction ring fuzzy mode.
Available accessories include:
- Panoramic filter, filter out K beta radiation
- Panoramic axial Soller, slit, decrease the Bragg - Brentano and Debye - Scherrer type bolt and peak asymmetry of diffraction geometry
- Panoramic vacuum flight line and the center beam keep out, can minimize air in small Angle X-ray scattering (SAXS) application.
application
Application illustrated
Technical parameters
EIGER2 R probe technical specifications
Technical specifications |
advantage |
|
Effective area |
250 k: 38.4 x 38.4 = 1475 mm squared |
Large, adjustable gamma and 2 theta - coverage |
pixel |
250 k: 512 x 512 = 262144 |
To provide superior spatial resolution in the effective area |
Pixel size |
75 x 75 microns squared |
Resolution of give attention to two or morethings and counting rate Minimize the charge to be Shared |
Maximum count rate |
> 3.6 x 10 ⁸ ph/s/mm squared |
Very suitable for high dynamic range measurements, such as XRR and HRXRD, without absorber |
Dynamic range |
> 10 ⁹ ph/s/mm squared |
The highest sensitivity, optimal 2 d data quality |
discriminator |
2, lower limit and upper limit threshold value |
Reduce the fluorescence and cosmic radiation, improve signal than the bottom |
technology |
The second generation of EIGER technology, the mixture of photon counting |
Fast converting photons, achieve the highest count rate and dynamic range |
The wavelength |
Cr, Co, Cu, Mo and Ag (5 keV - 23 keV) The stability of the synchrotron radiation |
A detector is suitable for various common wavelength There is no direct beam damage |
The thickness of the sensor |
450 microns | > 99% Cr, Co, Cu;50% Mo;Efficiency of 30% Ag sensor |
Scanning mode |
0 d, 1 d and 2 d step scanning and scanning in a row 1 d and 2 d snapshots and advanced scanning mode |
Comprehensive, unified 0 d / 1 d / 2 d scan Under the mode of all along the gamma - and 2 theta flexible choice ROI The patent is pending for undistorted 2 d data algorithm () |
Working medium |
There is no |
No maintenance, no additional material cost No media design, ensure the service life of the detector is longer, without daily maintenance |
application |
XRR, HRXRD;Phase identification and quantitative analysis, structure refinement, residual stress and micro texture, mapping, 2 d diffraction |
For more information
EIGER2 detector series of resources
Application notes and laboratory report
- Make use of EIGER2 perform X-ray reflection survey: research on the silicon substrate Ta coating and AlN/GaN superlattice structure
- Using EIGER2 R by RSM mass 500 k: analysis InxGa1 - LED, GaAs and Si1 xN - xGex epitaxial film
- By using EIGER2 R 500 k and DIFFRAC. TEXTURE TEXTURE analysis: research rolling and tensile aluminum plate
- 500 k measuring residual stress with EIGER2 R: 0 d, 1 d and 2 d mode research of polycrystalline tungsten coating on silicon substrate
- Using EIGER2 R 500 k perform geology mu XRD: in Georgia lapis study graves mountain scene
- Drug fast XRD analysis: use EIGER2 R 500 k 1 d and 2 d pattern snapshot scanning
Flyer page and product data sheet
support
Service and support
We offer:
- Professional senior technical personnel to do fault professional technical support, isolation and solve the problem of hardware and software
- Network remote service, providing diagnosis and application support
- Fusion reality support - virtual engineers in your side,video)
- According to your request to schedule maintenance
- Customer site maintenance, maintenance services
- Spare parts delivery will be within one working day/the world needs a few working days to complete
- Installation qualification and operational qualification/performance verification of compliance services
- Site planning and relocation
- Find nextA training course
Check out ourSupport site:
- Software updates
- Product manuals and installation guide
- Training video
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