LYNXEYE series detector is the world's highest performance composite silicon array detector, applicable to 0 d, 1 d and 2 d mode perform a variety of X ray diffraction and scattering.Three detectors, namely SSD160-2, 2 and LYNXEYE LYNXEYE - XE - T, can work under Cr - Ag average wavelength, no maintenance, compatible brooke all series D2 and D8 diffractometer.LYNXEYE series detector not only conforms to the strict technical specifications, and with the best quality and highest system and software integration.The result is of good generality, reliability and quality of data.
The second generation LYNXEYE probe further enhance the performance of the already very well: SSD160-2 and LYNXEYE - 2 energy resolution is increased by 30%, than any typical silicon detectors on the market more effectively filter fluorescence.In terms of the final data quality, LYNXEYE XE - T can provide superior data quality, its energy resolution equivalent to that of secondary monochromator, but without flux losses.
Diffractometer equipped with LYNXEYE detector has many benefits, including high speed data acquisition, excellent angular resolution and prominent peak back than.
LYNXEYE XE - T energy resolution of more than 380 eV, is the highest fluorescence filter on the market performance of detector system, and the only applies to 0 d, 1 d and 2 d data acquisition the energy dispersion of the probe.
Thanks to the excellent energy resolution, it can be to unprecedented fluorescent signal and K beta radiation filter, provide outstanding signal-to-noise ratio and optimizing LLD/LOD data.Realize all this, neither need secondary optical path optical element, such as the monochromator or metal filter, also won't produce flux loss.
For example, LYNXEYE XE - T can filter out 100% Fe Cu radiation emitted fluorescence, and the K beta radiation to < 0.1% (CuK alpha).The resulting data do not contain harmful scattering and artifacts, such as metal filter absorption edge.For the solid phase identification and quantitative analysis is essential, especially in relation to often become blurred in the background noise of trace phase.
In X ray powder diffraction experiment is a challenge, to ensure that the sample is composed of crystallite size appropriate random orientation.2 dx ray diffraction is a convenient method and can be deviated from the ideal state of powder of visualization.In addition, the beneficial practices include by associated linear enhancement phase identification process, and the quantitative analysis of reliability.
All detector LYNXEYE series supports two ways of 2 d data:
Equipped with brooke patent 0/90 ° base D8 ADVANCE and D8 DISCOVER diffractometer, using conventional 2 theta scan 2 d data in the 90 ° orientation.Use all diffraction are BRAGG2D, can be measured in the quasi focused beam diffraction geometry data, and use a new 2 d data processing algorithm for processing.In this way, can use the X ray to light a large sample size, rapid assessment and sample preparation.
Due to its high dynamic range, high count rate and fast read time, LYNXEYE detector series is the best choice for all applications, including material research.
Reciprocal space figure (RSM) for epitaxial layers membrane structure characterization and film properties evaluation, such as stress, the effects of component and domain) is very important.
Use LYNXEYE series all detector rapidRSM ™ technology, collection of RSM is a series of 1 d snapshot scanning, basic no dead zone.Scan time needed for this will greatly reduced to a few minutes or even seconds, increase the sample throughput.
For X ray reflection method (XRR) and high resolution XRD (HRXRD) measurement, signal intensity within the measuring range of changes to several orders of magnitude.As a result, high dynamic range is the key parameter of the probe.By switching to the LYNXEYE any detector series 90 ° orientation, dynamic range can raise nearly 200 times, no longer need the absorber, so as to accelerate the measuring speed, improve data quality.
specifications |
advantage |
|
SSD160-2 |
Channel number: 160 (up to 2400 subchannel) Energy resolution: < 1000 eV FWHM (< 8 kev Sigma 426 eV) Effective window: 12 to 16 mm x squared;2.5 °, radius of 250 mm Number of defects channel: maximum 1 (< 1%) The highest global count rate: 125000000 CPS |
Up to 125 times faster than the conventional detector system Excellent fluorescence filter Large dynamic range, such as for 0 d application |
LYNXEYE - 2 |
LYNXEYE - 2 Channel number: 192 (up to 2880 subchannel) Energy resolution: < 1000 eV FWHM (< 8 kev Sigma 426 eV) Effective window: 14.4 x 16 mm squared;3 ° cover, radius of 250 mm Number of defects channel: 0 The highest global count rate: 150000000 CPS |
Up to 150 times faster than conventional detector system Excellent fluorescence filter Large dynamic range, such as for 0 d application Ensure delivery of all silicon channel can be normal work |
LYNXEYE XE - T |
Channel number: 192 (up to 2880 subchannel) Energy resolution: < 380 eV FWHM (< 8 kev Sigma 160 eV) Effective window: 14.4 x 16 mm squared;3 ° cover, radius of 250 mm Number of defects channel: 0 The highest global count rate: 150000000 CPS |
High throughput mode, up to 150 x faster than conventional detector system;High resolution mode fast 450 x Large dynamic range, such as for 0 d application Ensure delivery of all silicon channel can be normal work And then to decide without K filter and secondary monochromator Fluorescent filter out 100% Fe and Cu radiation |
The spatial resolution |
75 microns |
|
Background noise |
< 0.05 CPS, the detector |
Outstanding signal-to-noise ratio data |
The wavelength |
Cr, Co, Cu, Mo and Ag |
A probe support all wavelengths |
The thickness of the sensor |
500 microns |
> 99% Cr, Co, Cu;50% Mo;Efficiency of 30% Ag sensor |
Scanning mode |
0 d: scan 0 d mode 1 d: scan or fixed mode, rapidRSM ™ and rapidNon - Ambient The 2 d: scan the 2 d pattern and BRAGG2D |
Great dynamic range, 90 ° rotation orientation Fast 1 d measurement BRAGG2D: use the divergent primary beam 2 d data |
Working medium |
There is no |
No maintenance, no additional material cost |
application |
XRR, HRXRD;Phase identification and quantitative analysis, structure refinement, residual stress, and texture |
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