X-ray reflectivity (XRR) can provide samples of vertical density distribution details, layer thickness and interfacial roughness.High resolution X ray diffraction (HRXRD) can measure the crystal structure of the sample.Grazing incidence small Angle X-ray scattering (GISAXS) nanoparticles can be used for analysis and porosity.Residual stress analysis of bulk sample can be detected and the strain state of the polycrystalline coatings.
In addition to the conventional single curve scanning, high resolution HRXRD LEPTOS can also analysis and XRR reciprocal space diagram, GISAXS stress test and XRD squared frame diagram, as well as the HRXRD, XRR and residual stress of site scans.With zero dimension, one-dimensional or two-dimensional detector data collected.
The graphical user interface can be customized to meet the scientific researchers and industrial operators different aspects of the requirements.
LEPTOS R is suitable for the analysis of X-ray reflectivity (XRR) data and the structure of the thin layers of diffuse scattering (DS) data.This module is fully integrated in the LEPTOS suit, can be used to analyze HRXRD, GISAXS and XRR data at the same time.As part of the LEPTOS suit, R modules have a whole set of common all functions.
LEPTOS R in many international benchmarking project (such as VAMAS project A10) won the high praise.LEPTOS R structure is in line with new XRR international rfCIF standard data format.
LEPTOS H can be used for analysis of high-resolution X-ray diffraction (XRD) and grazing incidence X-ray diffraction data.
This module is fully integrated in the LEPTOS suite, can be used to analyze HRXRD, GISAXS and XRR data at the same time.As part of the LEPTOS suite, H module have a whole suite of common all functions.
LEPTOS S is an innovative, powerful and comprehensive tools, applicable to the analysis using the classical sin2 bits of method using zero dimension, one-dimensional or two-dimensional detector test and expand XRD2 method of the residual stress of the test.The module is fully integrated in the LEPTOS suit, have the entire suit all common functions.
LEPTOS G is suitable for the analysis of small Angle scattering grazing incidence data, the data from the sample containing nanoparticles, these particles may be below the surface or on the sample surface.For example, these can be embedded or on the surface of the semiconductor quantum dot and island, porous materials, agglomerated powder, embedded in the polymer nanoparticles, etc.Authorization module G also contains the X-ray reflectivity R module.
version | The latest software version for V7.10.12 |
Analysis method |
Parratt dynamic methods The diversification of interface roughness model The calculation method of operation parameters of the X-ray scattering Eigen wave of patent method (MEW) Quick 2 x2 and precise 4 x4 recursive matrix method Traditional and extended sin2 bits of methods, as well as XRD2 method Residual stress is obtained by {HKL} more data analysis The thin polycrystalline coatings of stress/strain gradient |
The operating system |
Windows 8 and 10 (32 bit or 64 bit) |