X-ray diffraction (XRD)

DIFFRAC. XRR

DIFFRAC XRR is a powerful and easy-to-use software packages, X-ray reflection method is applied to the analysis of measurement data.

Bright spot

Comprehensive analysis of the X-ray reflection

DIFFRAC. XRR has two different analysis methods, can best meet the user requirements:

  • Fast Fourier transform (FFT) method, just click the mouse, then by X-ray reflection (XRR curve quickly estimate the film thickness.
  • Through fitting samples based on the theory of the dynamic scattering model, a detailed analysis of X ray reflection (XRR) measurements.

DIFFRAC. XRR aims to maximize the user in the process of the whole analysis efficiency: the model to generate a report sample results:

  • The sample of the flexible modeling, including free fitting based on the parameters of the formula and variables.
  • Comprehensive and extensible material and sample database.
  • Senior automation function and the working process, including macro recording and perform step by step.
  • Automatic analysis and display a series of reflectance measurements.
  • Wafer surface scan data assessment, including customizable contour map and statistical analysis.
  • Strong and broad with the function of the template report generator.

The characteristics of

Fast XRR analysis based on FFT analysis

When analyzing the task need to extract the film thickness, DIFFRAC. XRR software set the benchmark: just click the mouse, estimating tools by fast Fourier transform to evaluate film thickness, and according to the results directly to the corresponding XRR measurements in the map.

Through the analysis of the XRR full spectrum fitting in detail

For a detailed analysis to DIFFRAC. XRR software application accurately simulate the dynamic scattering theory.Using least squares model parameters of the sample (e.g., thickness, roughness, mass density) was optimized, make the XRR curve is consistent with the test data.To comprehensively consider the contribution of the experiment, such as instrument resolution, background, and the sample size), in order to accurately describe the measured results.A rapid and stable convergence of fitting method to ensure the best, which can provide reliable results.

Comprehensive material database

DIFFRAC. XRR software provides a comprehensive, extensible material database, it consists of amorphous and crystalline material and mixed crystal to quaternary compounds.In addition, the database also provides the structure factor or HKL pattern and X ray features (such as absorption and penetration depth, refractive index, polarization) calculation.For convenience to create a new database entry, can be directly imported. Cif files and. STR file.

The sample of the unmatched flexibility model definition

From simple single layer film to contain superlattices and gradient of highly complex structure -- DIFFRAC. XRR software for all: the different interface roughness model can accurately describe the growth of different form;Can link the parameters of the membrane to impose constraints;Additional free variable availability for modeling flexibility sets a new standard sample.

Fast and efficient work of the sample database

DIFFRAC. XRR software comes with a powerful database sample.

Can create and store the sample of the complex structure, and the load directly to the current analysis of the project.This greatly improve the efficiency of daily work.

And measurement software DIFFRAC. SUITE share the sample database, also can be more effectively planning experiments, which greatly support DIFFRAC. SUITE software platform plan, measurement and analysis of the concept.

Unparalleled reporting capabilities

DIFFRAC. XRR software including a professional printing and reporting system, is used to create sophisticated, can be published graphics and complete analysis report.

Can generate user customization and fully customized report template.Report can be printed directly, or through Shared to PDF files. Docx document for further editing.

automation

Conventional analysis of the X-ray reflectivity has never been so simple: DIFFRAC. XRR software can record macro instruction and in a single operation or execute them step by step mode.

Workflow designer to create workflow provides an intuitive interface, can guide the user through the data analysis, results from import data to generate a report, can even run it completely automatic.

Measurement analysis

Usually, the samples in different environmental conditions to a series of XRR measurements.

DIFFRAC. XRR software is quick and convenient to analyze such data series: sample each refinement parameters of the model can be shown separately as a function of environmental parameters.Additional statistical analysis can provide maximum insight into the properties and behavior of the sample.

Wafer analysis in detail

Wafer or surface scanning allows to determine the lateral uniformity of the sample.

DIFFRAC. XRR software has full wafer analysis function: each refinement of sample parameters can be displayed as a contour line, can display the parameters of statistical information in detail, and along the surface of the cross section allows to check the partial sample characteristics in detail.

Technical parameters

DIFFRAC. XRR specifications

version

The latest software version for DIFFRAC. XRR V1.0.

Analysis method

Used to quickly estimate the thickness of the FFT method.

Through the cyclic matrix form dynamical diffraction theory is established.

Effective density for ultrathin membrane layer simulation model (EDM).

For the most rapid simulation of the superlattice characteristic wave method (MEV).

The operating system

Windows 8 and 10

Both 32-bit and 64 - bit

support

Let your DIFFRAC. XRR keep the latest version

Free maintenance updates

Through a free DIFFRAC. XRR maintenance updates, your EVA version can be updated to the latest version.No matter what your XRR permission level is, you can via www.brukersupport.com as a free download the latest maintenance update.

Download the steps

  • In the "brooke customer support center (Bruker Customer Support) "registration
  • Click on the "software" button
  • Search for "DIFFRAC. XRR maintenance updates"
  • Download the update

Bug fix

By making your DIFFRAC. XRR keep the latest version, no matter what permission level is, you have the right to use all the patches to the current version and to repair all previous releases.DIFFRAC. XRR maintenance updates are cumulative, thus it can be used for any previous versions.

What is the upgrade?

DIFFRAC. XRR maintenance update doesn't come with new features.If you want to use the function, introduced in the new version, you need to buy the latest DIFFRAC. XRR upgrade services.