DIFFRAC. XRR has two different analysis methods, can best meet the user requirements:
DIFFRAC. XRR aims to maximize the user in the process of the whole analysis efficiency: the model to generate a report sample results:
When analyzing the task need to extract the film thickness, DIFFRAC. XRR software set the benchmark: just click the mouse, estimating tools by fast Fourier transform to evaluate film thickness, and according to the results directly to the corresponding XRR measurements in the map.
For a detailed analysis to DIFFRAC. XRR software application accurately simulate the dynamic scattering theory.Using least squares model parameters of the sample (e.g., thickness, roughness, mass density) was optimized, make the XRR curve is consistent with the test data.To comprehensively consider the contribution of the experiment, such as instrument resolution, background, and the sample size), in order to accurately describe the measured results.A rapid and stable convergence of fitting method to ensure the best, which can provide reliable results.
DIFFRAC. XRR software provides a comprehensive, extensible material database, it consists of amorphous and crystalline material and mixed crystal to quaternary compounds.In addition, the database also provides the structure factor or HKL pattern and X ray features (such as absorption and penetration depth, refractive index, polarization) calculation.For convenience to create a new database entry, can be directly imported. Cif files and. STR file.
From simple single layer film to contain superlattices and gradient of highly complex structure -- DIFFRAC. XRR software for all: the different interface roughness model can accurately describe the growth of different form;Can link the parameters of the membrane to impose constraints;Additional free variable availability for modeling flexibility sets a new standard sample.
DIFFRAC. XRR software comes with a powerful database sample.
Can create and store the sample of the complex structure, and the load directly to the current analysis of the project.This greatly improve the efficiency of daily work.
And measurement software DIFFRAC. SUITE share the sample database, also can be more effectively planning experiments, which greatly support DIFFRAC. SUITE software platform plan, measurement and analysis of the concept.
DIFFRAC. XRR software including a professional printing and reporting system, is used to create sophisticated, can be published graphics and complete analysis report.
Can generate user customization and fully customized report template.Report can be printed directly, or through Shared to PDF files. Docx document for further editing.
Conventional analysis of the X-ray reflectivity has never been so simple: DIFFRAC. XRR software can record macro instruction and in a single operation or execute them step by step mode.
Workflow designer to create workflow provides an intuitive interface, can guide the user through the data analysis, results from import data to generate a report, can even run it completely automatic.
Usually, the samples in different environmental conditions to a series of XRR measurements.
DIFFRAC. XRR software is quick and convenient to analyze such data series: sample each refinement parameters of the model can be shown separately as a function of environmental parameters.Additional statistical analysis can provide maximum insight into the properties and behavior of the sample.
Wafer or surface scanning allows to determine the lateral uniformity of the sample.
DIFFRAC. XRR software has full wafer analysis function: each refinement of sample parameters can be displayed as a contour line, can display the parameters of statistical information in detail, and along the surface of the cross section allows to check the partial sample characteristics in detail.
version |
The latest software version for DIFFRAC. XRR V1.0. | |
Analysis method |
Used to quickly estimate the thickness of the FFT method. Through the cyclic matrix form dynamical diffraction theory is established. Effective density for ultrathin membrane layer simulation model (EDM). For the most rapid simulation of the superlattice characteristic wave method (MEV). |
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The operating system |
Windows 8 and 10 Both 32-bit and 64 - bit |
Free maintenance updates
Through a free DIFFRAC. XRR maintenance updates, your EVA version can be updated to the latest version.No matter what your XRR permission level is, you can via www.brukersupport.com as a free download the latest maintenance update.
Download the steps
Bug fix
By making your DIFFRAC. XRR keep the latest version, no matter what permission level is, you have the right to use all the patches to the current version and to repair all previous releases.DIFFRAC. XRR maintenance updates are cumulative, thus it can be used for any previous versions.
What is the upgrade?
DIFFRAC. XRR maintenance update doesn't come with new features.If you want to use the function, introduced in the new version, you need to buy the latest DIFFRAC. XRR upgrade services.