New EBSD detector eFlash FS to achieve maximum sensitivity, deformation or light quality materials even in challenging applications can not affect the data quality of EBSD measurements at a high speed.In order to further improve the quality of acquisition of kikuchi patterns, eFlash FS cooling system upgrade, to reduce the functions of temperature, so as to reduce the dark current of the CCD camera.
Due to the sensitivity of three times four times and dark current (compared with the former eFlash 1000), a new eFlash FS detector is all "based on hough transform" the best choice of the EBSD applications.Camera sensitivity of huge promotion combined with high speed and high efficient screen, make new eFlash FS detector in situ tensile/compression test in situ heating and an ideal solution for dynamic experiments.
3 d EBSD is another important application, it will greatly benefit from the new eFlash FS detector sensitivity and speed of students.
Access to 400 x 300 pixel image/slice can now ready to fast, single slice only 2 minutes 10 seconds.This means that the 70 3 d EBSD data cube (8.4 M voxel) data acquisition part only need 2.5 hours.
Its excellent sensitivity make new eFlash FS detector in the low voltage EBSD applications and SEM called transmission EBSD (t - EBSD) transmission of kikuchi diffraction (TKD) the perfect solution.Adopt unique OPTIMUS ™ adapted the new detector TKD detector, the samples collected under the mode of transmission orientation distribution can now be as high as the speed of 630 frames per second (FPS), and to achieve effective spatial resolution of at least 2 nm.
Coaxial TKD typical measurement usually only a few minutes, not only in the case of does not affect the data quality significantly improved the efficiency, but also minimize the beam instability caused by defects.
EFlash FS also can match ARGUS ™ front/back scattering electronic imaging system.Further improve the versatility of the detector, and for a meaningful and effective microstructure features provide valuable additional information.