EFlash XS

Simplicity is the ultimate refinement!

In order to can gain increased significantlyEDS and EBSDIntegrated system, the number of laboratory brooke nanometer analysis company developed eFlash XS, it is a unique EBSD detector, focused on providing the most economical EBSD solutions on the market.EFlash XS EBSD detector is designed for installation in desktop electron microscopy (SEM) and design, or standard SEM has a small room.

ourEBSDProfessional use of existing systems, professional knowledge to develop the most reliable and most economical EBSD detector, at the same time, it provides excellent performance.EFlash XS专为实现最大可靠性、易用性和花样质量而设计,由支持像素并和的 CMOS 摄像机、用于最大透光的创新型光学系统和高性能荧光屏提供动力。它依靠 USB 3.0 与计算机连接(电源和数据同步连接)使 eFlash XS 成为真正的即插即用的仪器。在不使用时,EBSD 探测器在 SEM 中的部分可以滑出,进行外部存储,以消除 SEM 样品台与探测器碰撞的任何风险。

New eFlash XS EBSD and detectorESPRIT 2The software of the sixth generation XFlash®EDS detector highly integrated, which we call QUANDAX ED - XS,This is the entry level market analysis by SEM technology powerful combination.

New eFlash XS, the most reliable and affordable EBSD detector

Main advantage (hardware and software)

Ease of use

  • Without calibration - automatically correct WD changes impact on the center of the pattern
  • And don't need to do a pixel and/resolution changes;If you need, all pixels and patterns are available
  • The camera automatically gain
  • Automatic crystal phase Settings - without user intervention
  • EBSD probe insertion phase completely risk-free
  • The user can change the screen
  • Including independent and at the same time get EDS HyperMap and EBSD diagrams
  • Automatic data save
  • The user can choose whether the EBSD acquisition at the end of the EHT will be automatically closed

New users can accept training and practice EDS and EBSD, at the same time reduce the time limit

The quality of the sample preparation can be conducted on expensive FE - SEM before EBSD, check on the desktop electron microscopy (SEM)

The conventional EBSD analysis of SEM economic material benefit, to reduce the backlog of FE - SEM task

Important specification

  • The original image resolution: 720 x 540 pixels
  • Support the pixel and the pattern: 2 x2, 3 x3, 4 x4, 5 x5, 6 x6
  • Speed: all the pixels and mode of 525 frames per second (FPS)
  • The user can move probe head - slip and slide out of the mechanism
  • The user can change the screen
  • EBSD data and power transmitted through start cable (no additional cable or electric box)
  • Overall diameter: 84 mm length ~, ~ 48 mm in diameter