Oval windowless detector XFlash 6-100
Used for SEM, FIB, SEM and SEM STEM large solid Angle in the windowless EDS system
XFlash®6-100 oval windowless detector has the following advantages:
- 100 mm2Crystal area, no window design
- The space solid Angle acuity 0.4 sr
- Compatible with all SEM model, and applies to 30 kv maximum acceleration voltage
- Check out the Angle of 30 °...35 °
- Welded bellows and X-ray shutter (optional)
- No interference cooling system
- Detector automatic return function
- Excellent light and low energy performance
- Compatible with brooke powerful analysis software seamless
XFlash®6-100 oval windowless probe areas of application:
SEM, FIB - senior elements of STEM elements in SEM and SEM analysis, including but not limited to:
- Low voltage and high spatial resolution
- Light element analysis
- Electron beam sensitive samples
- Fast data acquisition