XFlash 6 t - 100
100 mm2The oval windowless detector
The 100 mm2Oval chip, collecting large solid Angle, windowless EDS detector, with optimization of the geometric structure, but with all of the TEM model matching to obtain the best effect.
Its unique chip shape and state-of-the-art agent refers to the fine chemical technology has made the probe X-ray collection space solid Angle sr 0.7 or greater in the STEM, detection Angle reached 13 ° or higher, it is easy to realize the atomic mapping and the identification of single impurity atoms[1, 2].
[1]Direct atomic scale determination of magnetic ion partition in a room temperature multiferroic material(Open Access)
Scientific Reports 7, (2017) Article number: 1737;The Authors: l. Keeney et al.
[2]Individual heteroatom identification with X - ray spectroscopy(Open Access)
Applied Physics Letter Volume 108, Issue of 16, 163101 (2016);The Authors: r. m. Stroud, t. c. m. Lovejoy, Falke, n. d. Bassim, g. j. Corbin, n. Dellby, p. Hrncirik, a. Kaeppel, m. w. Noack, Hahn, m. Rohde, and o. l. Krivanek
XFlash®6 t - 100 oval window detector's advantage:
- 100 mm2Crystal area
- No window design
- Collect solid Angle acuity 0.7 sr
- Check out the Angle acuity 13.4 °
- Compatible with UHV
- X-ray shutter
- No interference cooling system
- Excellent performance low-energy end, it's easy for spectrum peaks overlapping light and heavy elements of low-energy L, M, N line spectrum peak stripping
- With brooke powerfulAnalysis softwareSeamless compatible
XFlash®The advantage of 6 t - 100 oval window detector areas of application:
The top element of the TEM, STEM, spherical aberration electron microscope analysis, including but not limited to:
- Atomic resolution characterization of elements
- Fast data acquisition
- Trace element analysis