Bruker
Products and solutions application Service and support News and events About us professional
Please enter at least two characters (your current input is one character).

Languages

Exploration and mining of the double source (electron beam source and X-ray source) application: samples of epithermal gold

The micro areaThe combination of XRF and SEM makesIn a single system can analyze samples with multiple scales, from cm to mm to microns and even micron.Therefore, by the micro area added to SEM, XRF converts SEM to double source system, which means that there are two signal excitation source, namely, electron beam and X-ray photons.Any one source can be used alone, can also be used to generate the samples at the same time characteristic X ray, will use the same sample EDS detector is measured.In addition, you can use the advantages of each analysis: (1) background of XRF source is very low, this means that you can observe the element concentrations as low as 10 PPM (related to the elements and sample matrix), and greater depth of information, this means that you can view the sample below the surface of the structure or element.For example, even in very low concentrations, can also be detected under the surface of the inclusions;(2) of the electron beam can be focused to a tiny areas, and generate high resolution information.

This combination can now create a new workflow in a single system.For example, you can quickly scan a large rock samples, in this case, the use of micro area of XRF analysis from a Karangahake epithermal gold samples, containing Au grain can be determined (figure 1 and 2).Then, these we can take advantage of the electron beam at a higher resolution analysis "interested area" (figure 3).Therefore, the double beam system can identify large-scale at the same time to mm (cm) of relevant information, and can efficiently and accurately perform detailed analysis of the small scale to microns (mm).

Figure 1: SEM, XRF HyperMap diagram shows Au coverage area.Samples from New Zealand card langa huck gold mine.Analysis area of about 45 x was 45.
Contact the an expert Learn more about QUANTAX Micro - XRF
Figure 2: on the left side of the alpha line of SEM for Au - L - XRF element strength figure.Due to Au -l alpha and zinc - K beta peak overlap, but these overlapping peak solution of convolution is right, because, as shown in the spectrum image on the right side of the these images confirmed the existence of Au - L beta line, so these particles is gold.Figure area of 45 x 45 was in the middle.
Figure 3: on the left side of the alpha line of SEM for Au - L - XRF element strength figure.In selected small area, we use the SEM and EDS analysis, it provides a higher spatial resolution, and highlight the gold with the surrounding the relationship between the sulfide, such as Gelena (PbS), Sphalerite (FeS2) (ZnS) administered, pyrite and Chalcopyrite (CuFeS2).On the left side of the chart area of 45 x was 45.