Observe the change of the elements in the sample are very important to understand the geological processes and ore deposit genesis.The SEM is usedXRF dual-source system can be in micro areaLarge area element on X-ray surface analysis, which displayed on the PPM scale primary, secondary and trace elements.
The picture shows the micro area XRF from copper deposits in the sample area X-ray images (45 X 30 was), showed that copper (red), calcium (green), manganese (blue), silicon (purple) and chloride (dark green) distribution information of elements.In addition, in this sample, can detect the electron beamEDSBecause of low concentration and/or related elements of high energy line can't detect trace elements.This information can better understand their distribution, for the texture and mineralogy, and deposit genesis research lay the foundation.