Shown here is from New Zealand containing diamond kimberlite (South Africa, karp anwar carats) in the mantle of garnet and olivine SEM figure - XRF elements.The strength of the various elements of certain minerals exist in the sample;Such as Ca (green) - clinopyroxene;Cr (blue) - chromite;Al (yellow) - garnet and K (orange) from metasomatic metamorphism.useThe Micro XRF on the SEM analysis of thin section.Samples of about 3 cm x 2 cm, and with a frame analysis.Each pixel of the full spectrum diagram allows further offline processing, such as adding elements, ingredients extracted from figure phase calibration spectra, ingredients quantitative or from animals.
In micro area of XRF data to recognize samples high-energy X-ray line system and the advantages of trace elements.Micro area XRF is a spot analysis (about 35 microns in diameter), larger than the beam.Corresponding beam interaction source and the sample size is greater than the electron beam interacts with the sample volume, and is associated with elements and sample matrix.As a result, the electron beam and X-ray photon beam generated two-dimensional element surface analysis diagram may produce differences.Low background allows XRF spectrum detection beam can't detect trace elements.
The same sample preparation have different requirements.X-ray source, for example, won't be charged phenomenon, so it did not need the sample coating.In addition, because information depth deeper, XRF samples do not need high quality polishing.As long as the rough samples have relatively flat surface can be analyzed.Quantitative aspects according to user requirements, no sample can be quantitative, also can have the prototype quantitatively.