Data display options - post-processing

Flexible visual measurement result

Analysts often face how the easiest and most clearly shows the problem of data.ESPRIT EBSD software provides a large number of data representation tool to meet this demand.

Subset selection

ESPRIT offers analysts use different conditions to create data subset options, which can focus on specific requirements.Subset selection can be applied to many data and display options described on this page: diagram, histogram, polar diagram and phase list.Subset containing multiple operations, including composition, subtraction, intersection and extension.Data can also be used.

Stainless steel quality figure designs

Figure quality figure

This is an important tool to judge measurement quality.Design quality is influenced by acquisition parameters, sample properties.Such as phase, grain boundary, the lattice stress and sample preparation.Kikuchi designs pattern design quality, sharpness, every point in the figure using brightness encoded grayscale images.These images as the basis of with other type map overlay is very useful, because they show microstructure characteristics (e.g., grain boundary).

Phase diagram: stainless steel, the quality of pattern covering ferrite (red), austenite (blue), titanium nitride (green), titanium sulfide (yellow)

Phase diagram

All the identified phase are shown in the phase map of color coding.

High resolution figure

A figure

A figure is one of the most common said tools orientation data.They show that measurement of all the orientation selected (HKL) distribution.

Pole figure on which the intensity of texture and texture components dominate the important information.ESPRIT EBSD at an unprecedented rate generated polar diagram and corresponding to view the 3 d diffraction ball.

Inverse pole figure

Inverse pole figure (IPF)

Although very figure shows the results of crystal orientation reference sample machine coordinate system, but the IPF samples of the selected system shaft described as crystal vector.Because of the large number of symmetrical equivalent vector, so the IPF will be reduced to a symmetric specific subspace (as shown in the figure on the right side).

Is deposited on the silicon wafer of gold film of spatial visualization ODF

The ODF orientation distribution function

Using modern Open - GL technology can directly or indirectly, to realize the ODF space of 2 d cutting and 3 d visualization.

Stainless steel, the quality of figure figure with IPFX map overlay chart

IPF figure

IPF figure will detect the orientation of local combined with individual orientation of crystal reference.Color coding will zoom to the IPF.

Average grain orientation (GAM) shows ARMCO steel grain in situ tensile test at different stages of "deformation accumulation";Poor color display orientation Angle changes from 0 to 7 degrees

Eulerian graph
Euler map according to the code in the RGB Euler angles to display the crystal orientation of each point is detected.

Grain size analysis
Support the use of orientation and standard to measure grain size, can choose to remove ∑ 3 grain boundary.Grain size can be according to the shape, size, and the main shaft slope analysis (in the case of grain stretched).Grain the grain in the graph can be labeled with random colors.

Grain size analysis include poor orientation distribution function analysis.Such as the poor results and orientation along a line of orientation difference distribution histogram can be easily calculated.Poor orientation figure can give average grain orientation (GAM) figure, the kernel average orientation figure and the poor reference orientation figure (notes).

Texture components
EBSD ESPRIT supports the generation of texture component diagram, allows the use of rainbow palette from "ideal" texture orientation definition components and their distribution.This function can also be used to create subsets.