ESPRIT imaging
A variety of imaging options - from simple image acquisition to complete function of image processing
Image acquisition mode with scanning preview window
ESPRIT scanning
The use of external scanning system support instrument image acquisition software:
- Used for SEM, EPMA and STEM external electron beam mode switches, control and image acquisition
- The I/O scanning and SEMLink driver
- From the optional analog signal source (SE, BSE, HAADF) of high quality and high resolution digital image
- Used for scanning the area selection and fast preview mode of beam adjustment
- Independent select acquisition time, image resolution and scanning mode
- Pixels, lines, and average frame, including the power cord synchronization (option)
- Automatic and manual brightness, contrast and Gamma correction
- Support display histogram
- Mu indication and image by illustrations, including configuration options
ESPRIT colour scan
For X ray color enhanced images:
- Support without primary elements and X-ray range preset instant color images
- High-resolution electron image intuitive to distinguish the different color and shadow phase
- Impressive topology and chemical combination of contrast
- Easily search point and area of interest
- Highlight on the surface of the sample particles, distortion or unique area
- Uniform search area for accurate analysis results
- Progressive scanning and improve image quality
- The most suitable for high speed XFlash ® detector system
Processing and the marked image
ESPRIT Vision (Vision)
Digital image processing:
- Image filter configuration options are available, including binarization and inversion
- Brightness, contrast, and Gamma correction
- False color display
- Black and white and color image processing
- Mark, legend and user defined graphic overlay images
- Interactive length, area and Angle measurement, in the form of graphics overlay display data
- Multistage image processing, including the internal image storage and multiple "undo" function
- Support the import and export all common graphical format images
- Support Twain export and window to the clipboard
ESPRIT Stereo Vision (Stereo)
3 d image visualization and measurement:
- From stereo image reconstruction of 3 d surface topology
- The freedom to choose inclined shaft (including asymmetric tilt) helps to use standard SEM image acquisition
- Adaptive image comparison mode (glyph, and full frame differencing image correlation analysis)
- Single point depth calculation, line profile and more
- Powerful results of 3 d visualization, through the wire mesh, shadow, artificial texture or displacement vector
- To deal with project database, including raw data, results and Settings
ESPRIT DriftCorr (drift correction)
- Through the current image and start measuring when image comparison, compensation scanning sample area of the image changes
- In the process of collecting external scanning generator automatic correction
- Show the current and the maximum displacement and compare the quality of the process
- More than the most senior colonel stopped when measuring
- And the image acquisition function and more selection, analysis, scanning line, surface analysis and HyperMap options