The comparison of AFM and s - - IR SNOM
To study the best technology of application - strictly
AFM and s - - IR SNOM is complementary technology have different advantages.useNanoIR3 -s,You can choose to have a kind of technology or both two kinds of configuration, depending on your samples and measurement requirements.AFM using AFM probe tip - IR directly testing sample to absorb the light, to induce thermal expansion.The thermal expansion is mainly depends on the sample of ks absorption coefficient, and to a great extent, has nothing to do with the other optical characteristics of tip and sample.Therefore, AFM - IR technique requires accurate absorption spectrum measurement is the first choice.Due to the thermal expansion of these materials is very high, AFM is excellent in soft matter research - IR.
S - SNOM detectable directly in AFM probe tip of nano scale region scattering light.Scattering field depends on the tip and the complex optical constants of the samples, and contain rich information about the nano optical phenomenon.Reference samples (such as gold or silicon) is needed to response contributions and sample of the source separation and tip.May need modeling support to explain the results.S - SNOM is a remarkable technology, used in optical properties of nanoscale contrast imaging, in advanced materials, devices and the basic application of a variety of light/matter interaction.S - SNOM is most suited to interact with light intensity of hard materials.
