Conducting atomic force microscopy (C - AFM)
Researchers can change the conductivity of the process of a series of research and imaging, the studies and processes including electrical defect characterization as well as to the conductive polymers, semiconductors, nanotubes, and even some of the detection of organic materials.
Conducting atomic force microscopy (C - AFM) and related patternsTunneling atomic force microscope (TUNA)andPeakForce TUNA ™Sensing technology is a powerful current, represents the brook part of nano electrical characterization model series.
C - AFM is derived from"Contact model"The secondary imaging mode, the medium to low conductivity can be characterized and changes the conductivity of the semiconductor material.Pa can be used to 2 to 1 (including A range of current measurement and imaging, morphology information collected at the same time.
With MultiMode 8 PeakForce tunneling atomic force microscopy (PeakForce TUNA) module conducting atomic force microscopy (C - AFM) in the analysis, we can understand the doped semiconductor nanoscale conductive rate of a particular location.Thus we have at the nanoscale to explore many new materials and their electrical performance.In the past three years, we have been using MultiMode 8.I must point out that this instrument is really powerful.
