Contact mode
To provide the original mode of AFM, topography imaging and gateway to the advanced technology
Contact model is the foundation of all AFM technology, probe tip and sample surface keep constant physical contact.When scanning tip along the surface, the morphology of samples will lead to produce vertical bending beam.A feedback loop in the default load force cantilever bending capacity, and use the feedback response generated morphology image.
Contact model is applicable to materials science, biology, application and basic research.The model for other need to pinpoint direct contact with the sample of the SPM (scanning probe microscopy) technology laid a foundation.
Natural collagen fibrils showed a typical 67 - nm banded pattern.
