Kelvin probe force microscopy (KPFM)
For various sample surface potential measurement of high spatial resolution
Metal and semiconductor nanostructures can be used for all kinds of equipment from biosensor to solar cells.Because the surface of the nanostructures, surfaces and equipment potential can produce strong chemical and physical phenomena of the local and the effect of the researchers interested in analyzing the performance,.Kelvin probe force microscopy (KPFM) for various sample high resolution surface potential and morphology imaging.
Brooke provides two based onTappingMode ™Technology of KPFM mode:
- KPFM (also known as the surface potential model), the amplitude of oscillation amplitude modulation KPFM to probe changes for feedback
- KPFM - FM: frequency of oscillation frequency modulation KPFM to probe changes for feedback
PeakForce KPFM ™Accessories include the KPFM mode, and based on brooke patent technologyPeakForce Tapping ®The powerful KPFM mode.
The morphology of the laser diode and surface potential composite images.Scanning size 8 microns.
