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Atomic force microscope

Dimension FastScan atomic force microscope

Multifunctional high-speed AFM

Bright spot

Dimension FastScan

Dimension FastScan®Atomic force microscope (AFM) system is specially designed, without reducing the resolution, do not lose force control, do not increase the complexity of equipment, don't bring cumbersome operation under the premise of rapid scanning can be realized.Use FastScan, you can instantly get AFM images quickly and high performance expected high resolution of AFM.Whether you are > 125 hz scanning the sample surface to find the region of interest to find, or in the gas phase or fluid collection and AFM images at a rate of about 1 second per second, can use FastScan get excellent high resolution image.This transformative Dimension FastScan technology has redefined the AFM instruments use experience.

Refusal to compromise
High speed performance
Anywhere, anytime in any size on the sample of the high resolution imaging
real-time
Kinetics of nanoscale
Ultimate quick and stable pinpoint scanning mode directly show the dynamic behavior in the gas phase and liquid phase
automation
Setting, data acquisition and analysis
Operational simplicity, outstanding productivity, allows users to focus on their research work.
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The characteristics of

Characteristics of the

The benchmark of high-speed, high resolution atomic force microscope

Dimension FastScan is high-speed pinpoint scanning atomic force microscope system.Dimension FastScan能在各种尺寸的样品上实现高达每秒一帧的扫描速率，而不牺牲分辨率或任何仪器性能。结合Peak force®Tapping mode, Dimension FastScan using linear control loop to achieve the real time measuring the force, thus on various stiffness of sample surface, whether it is a hard, smooth or soft crystal surface rough polymer on the surface, can obtain high resolution of the morphology and mechanical properties.

The stiffness of the image point defect resolution of calcite.Image size is 15 nm (panel 1).The molecular level of resolution of iPMMA film adhesion force distribution of the image.Image size is 100 nm (panel 2).Samples by Martin Luther - haller - d he university professor magnar - albrecht.

The remarkable productivity

In ten minutes to six different samples are fully automatic acquisition, automatic optimization of image, obtain the high quality of the published data.

Every aspect of Dimension FastScan (including open big sample design and optimization software setup in advance) is specially designed, very simple and easy operation.Quick search of samples, quickly into the needle, a quick scan, low noise, low drift rate per minute (as low as 200 PM), strong expansibility of intuitive user interface, and combined with world famous Dimension large sample set, Dimension FastScan provides the operator with brand-new AFM using experience, available published data more quickly.Do not need the adjustment and optimization of heavy and complicated, the Dimension of FastScan users can obtain high quality results immediately.

The rapid development of new applications and access to new information

The sample search is unknown in order to understand the regional heterogeneity, characteristics of regional characteristics and mechanical properties of commonly used methods.Below is FastScan sampling survey, the survey produced a group of high quality image, from 20 microns of high-resolution overall morphology to local 10 times smaller than the original scanning range.From a only took eight minutes of scan multiple channels can be obtained in the high resolution data, each data channels are playing in the 16 million, can clearly reveal the various properties of the sample.

Study on the preparation of the hydrophobic polystyrene film on the surface of the wafer (thickness below 100 nm) to drive the driving force of the wetting and dehydration
Amorphous drug formulation research, capture 60 sites in 60 minutes.Samples from Basel, Switzerland M.E. raul, o. glassman, f. hoffman - laroche provide.

application

AFM mode

Using AFM to expand your application

With a set of excellent AFM imaging mode, each study brooke help you provide the applicable technology of AFM.

Imaging model based on the core (contact mode and tapping mode), brooke provides a full set of AFM test mode, allowing users to detect samples of electrical, magnetic and other rich performance.Brooke original new peak force tapping technology as a new core imaging model, has been applied to a variety of measurement mode, can provide morphology, electrical and mechanical performance data at the same time.

To know more about AFM mode

Dimension FastScan database

Polystyrene - poly (methyl methacrylate mixture sample loss modulus distribution of 3 d rendering.Blue area modulus is higher, the red areas lower modulus, respectively corresponding to the polystyrene matrix and polymethyl methacrylate embedded objects.Loss modulus distribution using brooke patent quickly and force array model, the scanning range is 5 microns, resolution of 256 x 256, vibration frequency is about 590 kHz.
To get the best lateral resolution, we need to probe close to the sample, but not too close.Peak force轻敲模式独有的精确力控制能够实现这一点从而获得最好的分辨率。攻打独一无二允许您这样做。有关针尖样品相互作用的详细建模，请参阅Physical Review B 56(7), 4159, 1992 和Chemical Review 88, 927(1988)。
Using PeakForce QNM pattern collection of graphene on hexagonal boron nitride modulus distribution images, reveals the aligned with high local strain relief after the transition to the corresponding lattice.Reference Nature Physics 10, 451-456 (2014).
In the entire history of the wafer level for Mr Roughness (~ 0.1 nm).96 measurements are made within 2 hours.
Using high resolution in rapid tapping mode Icon scanning head can also greatly improve the scan rate.
Polymethyl methacrylate (cyan) matrix of syndiotactic polypropylene (violet) area.Three-dimensional topography of the color standard modulus, can clearly reveal the syndiotactic polypropylene penetration in the matrix.Image size is 8 microns.
The current distribution of imaging in vertical standing carbon nanotubes.Only use PeakForce TUNA model to obtain the conductivity of the sample distribution.
Left: use of the peak force acquisition function force array images under the atomic scale, clearly reveals the vertical distribution of atoms.Right: using the peak force acquisition function to obtain the average force curve shows the solvation structure on the surface of the sample.
Using the peak force of tapping mode for calcite and mica surface morphology under the atomic scale image (right) and the corresponding force curve (left).
Highly oriented cracking on the surface of the graphite C36H74 alkanes self-assembled structures.
In Dimension FastScan system supports the use of Icon or FastScan scanning head in brooke patent PeakForce QNM model to obtain the surface in the mechanical properties of the nanoscale distribution.Using this technique, researchers can quickly get high resolution morphology at the same time to obtain the nano mechanics quantitative or qualitative information of the sample.
1 second, the use of Dimension FastScan system to collect DNA molecules on the surface of the liquid phase of mica (preparation) by the method of the APS in the dynamic process of 1 seconds.Samples from the university of Nebraska, y. liu has provided.
Using brooke proprietary peak force tapping mode at the nanoscale characterize the electrical properties of the samples, to achieve better sensitivity, resolution and dynamic range.PeakForce TUNA and PeakForce the SSRM provide unique nano electrical characterization ability, also can get nano electrical properties information at the same time.
In nanotechnology and molecular scale manipulation and etching.XYZ direction of the whole closed loop Icon scanner provides a precise positioning of probe, the zero creep and low noise design of piezoelectric guarantee at any appropriate nano manipulation of the system to achieve the most accurate positioning.
In all sorts of AFM scanning mode, the samples use the heating - cooling equipment to temperature control, temperature control range from - 35 ° C to 250 ° C.Or use the probe to the nano area heated to 500 ° C.
In all sorts of AFM scanning mode, the samples use the heating - cooling equipment to temperature control, temperature control range from - 35 ° C to 250 ° C.Or use the probe to the nano area heated to 500 ° C.
Using Dimension FastScan to gain high resolution in graphene morphology, adhesion strength, modulus and variable distribution.

accessories

accessories

Brooke AFM probe

Brooke AFM probe

In our online store to find all sorts of AFM probe, probe and accessories.Within the AFM professional knowledge we put in each probe!
To read more
Dimension AFM automatic measurement software system

AutoMET software

Dimension AFM measurement automation software system
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webinar

webinar

Recently the AFM webinars

User feedback

recommended

How do you say to customers

We have been using brooke fast scanning AFM for more than two years.According to our experience, Fastscan speed is faster than other AFM image of four to five times, and won't reduce the resolution.In addition, ScanAsyst model with intelligent automatic scanning parameter adjustment function, enable us to easily rapid scanning many samples.Excellent Fastscan AFM performance has many publications in the field of DNA nanotechnology research, make the group's reputation.

Dr Shou-jun xiao, nanjing university, nanjing, China

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