Bruker
Products and solutions application Service and support News and events About us professional
Please enter at least two characters (your current input is one character).

Languages

Atomic force microscope

Dimension XR atomic force microscope

Nano mechanics, electricity and nano electrochemical study of the ultimate solution

Bright spot

Dimension XR

Brooke's Dimension XR scanning probe microscope (SPM) system buzzing around the atom force microscope decades of research and technology innovation.Through conventional real atomic resolution, and a series of unique technology, including peak force tapping mode, data cube model, SECM and AFM - nDMA, Dimesnion XR system can provide the strongest performance and functionality.Dimension XR series of integrating these technologies to provide complete solution, in order to meet the mechanical, electrical and nano electrochemical nanotechnology applications demand.In the air, fluid, electrical, or chemical reaction environment quantitative research of materials and nanometer scale system has never been so easy.

Compose a specular like
Nano electrical characterization
Including for functional materials, semiconductor and represent the most complete electrical energy research technology of AFM.
Nanoscale resolution
Electrochemical imaging
Provide the nanoscale batteries, fuel cells and corrosion related local quantitative analysis of electrochemical activity of the highest resolution of complete set of solutions.
Super easy to use
Nano mechanics analysis
The set completely quantitative solution, used for the structure of the materials and nano mechanical properties characterization.
Download the manual

The characteristics of

At the highest performance to support the first and the only function of AFM

In view of the advanced research optimizing configuration

XR nano mechanics

XR nano mechanics provides a series of advanced application mode, its the molecular resolution the smallest element of structure of single polymer chain can be realized the comprehensive study.Researchers will nano mechanics data and dynamic mechanical analysis and macro scale research and brooke proprietary AFM - nano indentation nDMA ™ mode.From soft sticky hydrogel and composite materials to the hard metal and ceramic, implements the quantitative characterization of nanoscale.

XR nano electrical

Dimension XR nano electrical suit covers most widely AFM electrical technology.Researchers using proprietary DataCube mode, which can capture every pixel point of electronic information, and associated Yu Lixue performance characterization results, which provides the past a single measurement under the condition of unable to get the information.

XR nano electrochemical

Dimension XR nano electrochemical configuration can be realized based on the stability of the AFM scanning electrochemical microscopy (AFM - SECM) and electrochemical AFM (EC - AFM) function.Researchers can collect material at the same time in the system of nanoscale electrochemical, electrical and mechanical properties.

All patterns, all environment of the highest resolution

Whether it's real atoms in liquid environment samples, or get the sample in air modulus and electrical conductivity distribution of atomic resolution, Dimension XR system in all measurement can provide the highest resolution.They use brooke proprietaryPeak force tappingTechnology in all kinds of hard and soft samples on the performance characterization has become the industry benchmark, including polymer molecules in the defect or deficiency in the crystal.Same technology also is used to distinguish coarse fine rolling on the glass structure, and has striking stability, after hundreds of times scanning can still maintain the original resolution.Dimension XR system will peak force tapping mode and ultimate stability, unique probe technology and brooke dozens of years of experience, the combination of needlepoint scan on the samples of all kinds of size, weight, or medium, in any application implements a stable high resolution imaging.

Revolutionary AFM - nDMA

Four component polymer (COC, PE, LLDPE, elastomer) of high resolution figure storage modulus (left) and the corresponding point (right) acquisition of storage modulus spectrum.

AFM for the first time, we can study at the nanoscale polymer samples in rheological property related frequency performance of the linear area, provide complete quantitative analysis of viscoelastic.Proprietary dual channel detection, phase-shift correction and reference frequency tracking technology in rheological related 0.1 Hz and 20 kHz frequency range small strain measurement, analysis and macro DMA in storage modulus, loss modulus and loss tangent value, etc.

For more information

Proprietary data cube model

These patterns usingRapid force arrayPatterns in each pixel points executive force curve measurement, and has the user to define the residence time of data collection.Using high speed data capture capabilities, perform a variety of electrical measurement during the stay, which produce electrical and mechanical spectrum on each pixel.Data cube modelProvide a complete characterization in a single measurement, this is unheard of in the commercial AFM.

Dimension XR provide multidimensional data cube model in each pixel nanoscale information, collection of electrical and mechanical characteristics in a single measurement.
DCUBE - PFM measurement clearly show BiFeO3 film on each of the ferroelectric domain under different electric field polarization reverse it.
For more information

Exclusive peak force of scanning electrochemical microscopy

Brooke (A) sole pre-loaded peak force tapping scanning electrochemical microscopy probe provides A simple, safe handling and stability to the extreme, imaging and used multiple times in A few hours - cleaning cycle can maintain the best resolution.(B) probe scanning electron microscopy (sem) images;(C) using COMSOL simulation in 10 mm [Ru (NH3) 6] 3 needlepoint electrochemical current distribution in solution;(D) choose from 50 times continuous scanning of 1, 25 and 50 times cyclic voltammograms scanning spectrometer, scanning rate of 20 mV/s;(E) for up to 2 hours of constant current test, based on Ag/AgCl reference electrode.(F) simulation (dotted line) and the experiments approaching curve (solid line).C and E image by the California institute of technology, c. Xiang and y. Chen.

With nanoscale spatial resolution peak tap scanning probe microscope redefined the nanoscale electrochemical process in the liquid.Peak force tapping scanning probe electrochemical microscopyOn the order of magnitude significantly improved and the resolution of the traditional method.This makes the energy storage system, corrosion science and biological sensors, a new research for a single nanoparticles, nano phase and the pore, the measurement of the new opened the door.Can only tapping scanning probe electrochemical peak force microscope morphology, electrochemistry, electrical and mechanical distribution at the same time, and lateral resolution with nanometer scale.

For more information

application

AFM mode

Using AFM to expand your application

With a set of excellent AFM imaging mode, each study brooke help you provide the applicable technology of AFM.

Imaging model based on the core (contact mode and tapping mode), brooke provides a full set of AFM test mode, allowing users to detect samples of electrical, magnetic and other rich performance.Brooke original new peak force tapping technology as a new core imaging model, has been applied to a variety of measurement mode, can provide morphology, electrical and mechanical performance data at the same time.

To know more about AFM mode

XR database size

Use of the tapping mode high directional methanol pyrolysis graphite surface micelles with high resolution image.Three images clearly show the spacing of 5 nm herringbone structure, the spacing of 0.5 nm fine cycle structure is clearly visible.Scan range is 250 nm, height direction stick to 1 nm.The data provided by Dr Mr DE leather TengGe.
Using the peak force of tapping mode for aluminum silicate glass image, represents a industrial samples in the highest resolution imaging in the air.Keep the sharp tip is the key to obtain high resolution.Needlepoint refactoring structure shows 1 nm after imaging tip radius, instructions in this very challenging hard surface imaging did not wear needlepoint.Imaging range is 5 um, 5000 x5000 pixels.Peak force value of pn 600, using the FastScan B probe.The data provided by Dr Shui-qing hu.
Use PeakForce TUNA module acquisition of high directional current distribution on the surface of the pyrolysis graphite, clearly shows the atomic lattice of graphite phase, cycle is 0.25 nm.In the past to get such high resolution results only using scanning tunneling microscopy (STM).Probe used for PF - TUNA, the current color code for 60 pA, height gauge is 0.5 nm.Photo by jose, hart, Dr.
Using Dimension XR nano mechanical system distribution reveals that the adhesion of the molecular scale of polymethyl methacrylate polymer chain structure.
DCUBE - PFM measurement clearly show BiFeO3 film on each of the ferroelectric domain structure under different voltage.

accessories

accessories

Brooke AFM probe

Brooke AFM probe

In our online store to find all sorts of AFM probe, probe and accessories.Within the AFM professional knowledge we put in each probe!
To read more
Dimension AFM automatic measurement software system

AutoMET software

Dimension AFM measurement automation software system
To read more

webinar

webinar

Recently the AFM webinars

For more information

For more information

Please enter at least two characters (your current input is one character).

Contact us

Contact us

* please fill out the required fields.

Please enter your name
Please enter your last name
Please enter your email address
Please enter your company/organization
Please select your country/region
Please select your state
The current situation
Whether to subscribe to E-mail, in order to receive the webinar invitation, product announcements and nearby activities.
Please accept the terms and conditions

privacyStatement of terms of use

This web site are protected by the with reCAPTCHA and GooglePrivacy policyAs well asThe terms of serviceTo apply for.