NanoScience NanoWizard V
Bright spot
NanoScience NanoWizard ® V
NanoWizard ® V perfect combination of a wide range of scanning high space-time resolution imaging, flexible design of experiment, and the characteristics of high-end optical microscope system fit seamlessly.Automated setup, calibration, and parameter adjustment for a long time since the adjustment experiment bring more likely.
The characteristics of
Understand the fifth generation NanoWizard NanoScience AFM
Nanowizard ® V reached new heights in terms of automation, at the same time provide a series of new technical ability and leading the user experience.
Full of all kinds of innovation, the latest generation products
Consistently for more than 1000 users in the world, the success of the protection
, with focus on the high resolution imaging, a quick scan, and probe customized applications research and development support
Convenient V8 software environment
Unparalleled ease of use
The ideal choice, multi-user environment
Perfect performance, higher output
NanoWizard V is a excellent nano science research tools, unique to technology innovation, performance, and user experience together.
Pave the way for new scientific discoveries
Scanner, low noise and detection system to ensure the performance of the high resolution data and incomparable
High speed scanning rate is as high as 400 line/SEC
The ideal choice for dynamic, real-time research process
Automation, higher efficiency and the largest capacity
Nano mechanics of high resolution imaging, including PeakForce - QI ™, PeakForce Tapping ®, PeakForce QNM, and QI, the variety of imaging mode
· DirectOverlay realizes the AFM and an excellent integration of advanced optical microscopy
The latest ExperimentPlanner and ExperimentControl option
Numerous accessories for environmental control, electrical measurement, and more
Excellent performance
, from the atomic lattice to the diversity of the large scale sample imaging
A large number of additional components
The expanded function of the AFM, joining together the optical field
The optimization of the parameters of the storage and collection
Convenient user operation
, standardization of batch analysis program is used to generate statistics related data sets
The probe and the probe calibration, the automatic process
Capture the harsh environment of rapid dynamic process
Track, from milliseconds to seconds to minutes of reaction process under different time scales
"NanoWizard AFM performance is excellent.On NanoWizard V, brooke has realized the automatic calibration and large scanning size of fast imaging, which solve the practical problems of users.This instrument so that the experiment could expand the scope of the routine once difficult experiment."
Dr Nic Mullin
Sheffield university department of physics and astronomy, biophysical imaging center senior academic director
Overall the nano mechanical characterization
Brooke constantly strive to improve their ability of nano mechanics characteristic of atomic force microscopy, working for the complex science provides easy technical solutions.
NanoWizard V is quantitative research nano mechanical properties, and understand them in a key role in the structure, morphology and molecular interactions of ideal solution.
NanoWizard V broke through the boundary of the science, the AFM technology open to a wider range of application, and makes the nano mechanical characterization for all users in the field of science more quickly, more convenient, more easy to learn.
Unparalleled ability to
Combined with rapid scanning and easy to use features of morphology and nano mechanics imaging
Using micro rheological measurement, can characterize viscoelastic
· contact resonance for solid sample (> 10 GPa) on the mechanical characterization
Convenient, and powerful RampDesigner software
High sensitivity of force control and probe protection function
Real force curve real-time monitoring
, in a single measurement for mechanical imaging combined with electrical sample characterization
Quantitative imaging of a new chapter
PeakForce - QI is PeakForce Tapping and QI mode of symbionts, offers a unique quantitative nano mechanics imaging capability.It combines the highest collection rate and advanced force control, provides the highest resolution image more parameters.Automatically set, operation and calibration experiment setting and operation become very simple, even if not an expert can quickly and easily get high quality images and data.
Powerful data analysis
Batch processing, simple and reliable
Under different force, the flexibility to obtain the morphology of the image
(contact) imaging, zero force
By batch processing, arbitrary channel output image set
The acme of automation and convenient operation
NanoWizard V is from today's scientific research and industry scientists to meet specific needs.Hardware and software solutions to improve the capacity of innovation, automated measuring process and batch processing program that enable scientists to focus on the important things - their research.
The highest level of automation
Laser detection system, automatic calibration
Automatic probe calibration
HybridStage or electric machine, used for automatic multiple imaging area
, using ExperimentPlanner achieve convenient automation test script design
· ExperimentControl for remote monitoring experiment
Convenient operation
Software based on workflow, superior ease of use
, user management system suitable for multi-user facilities
Integrated software, use the help
The optical image calibration, a key
, integration camera calibration for laser detection system
Comprehensive data processing program
, convenient the parameters of the preservation and favorites add functionality
Unique design brings unparalleled flexibility
NanoScience AFM NanoWizard V original pinpoint scanning technology and modular design can be combined with the advanced optical technology seamlessly.
Many advanced mode and accessories to make it part of today's applications on the market the most flexible atomic force microscope, can realize the experiment setting and a variety of environmental control.
A number of additional components and accessories
, a wide range of temperature control parts (120 ℃ to + 300 ℃)
, the scanning thermal microscopy (SThM)
Magnetic force microscopy (MFM),
Nano manipulation,
Friction force microscope,
Multimodal imaging
Tensile machine,
All kinds of liquid pool
More options to see parts manual
High resolution electrical characterization
Conducting AFM (CAFM),
Kelvin probe force microscopy (KPFM)
Electrostatic force microscopy (EFM),
Pressure, power microscope (PFM)
Scanning tunneling microscope (STM),
Scanning electrochemical microscopy (SECM
Complex experiment, from the polymer to solar cells
The control of the environment, optimization options
Samples, optical AIDS, such as using a specific lighting
980 nm to detect laser option
For a long time, unmanned experimental models
Large samples quick scan new heights
NanoScience NanoWizard V platform achieved in large area scanning a quick scan.All three axis of full scan range still work, providing unparalleled scanning speed, without having to locate samples or reduce the imaging speed can be realized easily switch between different sample characteristics.
Quick scan option is the ideal choice of the research on dynamic process, provides real-time study of crystallization, the growth of the crystal, melt and the formation of domain the phenomenon such as the required speed and accuracy.
Automation of AFM in innovative fast scanning function
, increase output and to maximize capacity in order to get reliable statistical analysis
Quick Z piezoelectric ceramics with high resonance frequency, provide the fastest feedback
, based on the adaptive intelligent scanner scan rate is as high as 400 line/SEC
· NestedScanner techniques can be a quick scan of the big ups and downs samples, can be up to 16.5 (including m z range
, active balance in large scanning area make it possible to rapidly scan
High resolution electrical characterization
Conducting AFM (CAFM),
Kelvin probe force microscopy (KPFM)
Electrostatic force microscopy (EFM),
Pressure, power microscope (PFM)
Scanning tunneling microscope (STM),
Scanning electrochemical microscopy (SECM),
Stability, data accuracy, and ease of use of perfect and unified
, the use of advanced closed-loop control for a quick scan
, equipped with capacitive sensor quickly z - piezoelectric device, can obtain the highest accuracy data
The latest feedback technology, to provide accurate force control
· DirectDrive function is used to improve the stability of the probe excitation
Batch processing and advanced data analysis program
Video creation,
application
NanoWizard NanoScience database
Brooke BioAFM make life science and biological physics mechanics and the researchers were able to in the cell adhesion, mechanical biology, cell - cells and cell surface interactions, dynamics and cell morphology in the areas of further research.We collected a gallery, show some of the applications.
Technical parameters
Technical parameters
Measurement model
Standard measurement mode
Now equipped with PeakForce - QI, including PeakForce Tapping, QI, and PeakForce QNM
, including support for NestedScanner technology rapid PeakForce Tapping and QI
, contact model and the lateral force (LFM)
, tapping mode (TappingMode ™) phase imaging (PhaseImaging ™)
· ExperimentPlanner process to design a specific measurements
Static and dynamic force spectrum
, advanced imaging
The optional mode
Advanced power spectrum model, such as various power clamp mode or user custom force spectrum experiment design
Rapid scanning options, line rate is as high as 200 hz
QI, a senior model can obtain the quantitative data, it is the perfect choice for soft samples
In PeakForce ScanAsyst, Tapping and automatically adjust the scanning parameters in PeakForce - QI
Advanced AC mode, such as with Q control and take the initiative to gain control of frequency modulation (FM) and phase modulation (PM) model
· CellMech Package for micro rheological test
Kelvin probe microscope
Magnetic force microscopy (MFM), and static electricity microscopy (EFM)
Conducting AFM,
Scanning tunneling microscope (STM),
Electrical spectrum model
Have high pressure function, pressure electric microscope
With temperature control, the electrochemical and optical microscope and scanning electrochemical model
Etching and nano manipulation
Nano indentation
The scanning thermal AFM
, support Cytosurge FluidFM ® micro flow control solutions
ExperimentControl function for remote control experiment
DE CellHesion, TAO and HybridStage module provides additional x, y, or Z direction of the movement control sample
accessories
Most types of accessories on the market
Optical system samples/accessories, electrochemical solution, electrical characterization, environmental control options, software module, temperature control, acoustics and vibration isolation solution, etc.Brooke will provide you with the appropriate accessories, in order to control your samples conditions and succeeded in the experiment.
webinar
Watch the recent BioAFM webinars
Our network seminar covers best operation method, introduce new products, provides quick solutions to difficult problems, and provide ideas for new applications, patterns, or technology.