Streamline desktop ContourX series, equipped with advanced white light interference module, rapid automatic focusing and automatic brightness conditions and tilt control, manual sample
Bright spot
ContourX - 100.
With the highest cost-effective ContourX - 100 optical profiler for accurate and repeatable, non-contact surface measurement set a new benchmark.Cover an area of an area small, the system USES the simplified scheme combines brook decades of white light interference (index) innovation patent technology, is a powerful 2 d / 3 d high resolution measurement capability.A new generation of enhancements include a new platform for the 5 mp camera and update, achieve more sewing function, and a new measurement model USI, improves the machining surface, thick film and the tribological application convenience and flexibility of the measurement.ContourX - 100 is the most valuable desktop system.
The white light interference all objective to provide a constant vertical resolution.
Contourgraph is brooke ContourX - 100 for more than 40 years in the field of non-contact measurement, surface characterization and imaging proprietary optical crystal of innovation and industry leadership.The system USES the three dimensional index and 2 d imaging technology, a collection of executable analysis for many times.ContourX - 100.在反射率 0.05% 到 100% 的所有表面情况下都能发挥稳定性能。
The unique value and analysis
Manual ContourX - 100 platform.
ContourX - 100 desktop executable thousands of custom analysis, and USES the brook is simple and powerful VisionXpress and Vision64 user interface, improved laboratory and production efficiency of the factory.The perfect combination of hardware and software, to realize the efficient optical performance, easy operation, full beyond the similar measurement technology.
application
application
Surface - Independent Metrology with Application - Specific Solutions
Precision Engineering
Keep the surface texture and geometric dimensions of precision - engineered parts within tight specification limits. Our gage - capable measurement systems dojo.provide efficient feedback and reporting as you monitor, track, and evaluate the processes and assess GD&T conformance.
MEMS and Sensors
Perform high - throughput, highly repeatable etch the depth, film thickness, step - height, and surface roughness measurements, as well as the advanced critical dimension metrology of MEMS and optical MEMS. Optical profiling can characterize devices throughout the manufacturing process from wafer to final test, and even through the transparent packaging.
Orthopedics/Ophthalmics
Obtain precise and repeatable measurements of impla雷竞技网页版nt materials and components through the complete product life cycle. Our index optical profilers support R&D, QA, QC and analyses, the for applications held characterization of surface parameters of lens and injection molds to surface finish verification and wear of medical devices.
Tribology
The Measure, analyze, and control the impact of friction, wear, lubrication, and corrosion on the material/component performance and lifespans. Determine policy wear parameters and perform fast pass/fail inspections on the widest range of shiny, smooth, or rough surfaces.
Semiconductors
Improve yield and reduce costs for both front and back - end manufacturing the processes with automated, non - contact, wafer - scale metrology systems. Perform post - CMP die flatness inspection;Bump height, coplanarity, and defect identification and analysis;And measure the critical dimensions of component structures.
called
Better understand the root causes of the defects and optimize polishing and finishing the processes with accurate and repeatable sub - nm roughness measurements. Our non - contact metrology systems enable the compliance with his stringent specifications and ISO norms for samples held small aspheric and free - form called, to optical components with complex geometries', to diffraction gratings and microlenses.
