In situ nano mechanics test

Electrical characterization of module

In the nano indentation, compressive or tensile state, in situ and characterization of the electrical characteristics and mechanical properties of a powerful tool
The growth of the compression method of VLS n type doping silicon nanometer column when the electrical characterization.D.D. Stauffer doctoral thesis, nanoscale deformation mechanism of the brittle material ", "university of Minnesota (2011), pp. 152-150.

Brooke used in PI series instrument of electrical characteristics of in situ measurement module (ECM) for synchronous electrical and mechanical measurement provides a powerful solution.Through the conductive path between the probe and the sample applied voltage, can continuously measure the changing electric contact conditions, these conditions is a function of applied force and displacement of the probe.Certain point measurement can be achieved by using an electron microscope imaging to confirm the correct tip position to operate.Needlepoint electrical measurement can also be used for understanding such as columnar microstructure and particles, or mechanical and electrical properties of nanostructures.Electron microscope vacuum environment can minimize the influence of humidity or moisture absorption.

In order to enhance the function of the ECM, MEMS electrical pressure switch module type (E - inhibits PTP) device can be used in the standard measurement method of measuring the sample resistivity at four o 'clock at the same time, a tensile test.Current source electrode and voltage sensing electrode separation can eliminate lead resistance and contact resistance in measuring process, so as to get accurate electrical characteristics.Can also be used to measure the voltage scan IV curve, while the real stress and strain by monitoring and measuring of the sample size of electron microscope to be sure.