89年Hysitronπ扫描电镜联用纳米压痕仪利用扫描电子显微镜(SEM、FIB / SEM)的卓越成像能力,可以在成像的同时进行定量纳米力学测试。这套全新系统搭载力量领先的电容传感技术,继承了引领市场的第一批商业化原位SEM纳米力学平台的优良功能。该系统可实现包括纳米压痕、拉伸,微柱压缩,微球压缩,悬臂弯曲,断裂,疲劳,动态测试和力学性能成像等功能。
89年Hysitronπ的紧凑设计允许最大的样品台倾斜,以及测试时成像的最小工作距离.PI 89为研究者提供了比竞争产品更广阔的适用性和性能:
Hysitron PI 89 using brooke advanced nanoscale sensors and pressure electric drive structure to achieve the real displacement control and load control test:
Hysitron PI 89 obtained by in situ mechanical test results and SEM imaging synchronization and tied for display.This allows the user to observe defects, strain, thermal/electrical stimulation for engineering materials performance, longevity and durability from the scale of nanometers to microns.This synchronization to realize more analysis:
The Hysitron PI 89 modular design support almost all of The in situ testing technology innovation.Two sets of samples of rotate/tilt table design for advanced imaging function and FIB processing.
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